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Fluorine-Enhanced Room Temperature Luminescence of Er-Doped Crystalline Silicon

dc.contributor.authorWang, Xiaoming
dc.contributor.authorHe, Jiajing
dc.contributor.authorJin, Shenbao
dc.contributor.authorLiu, Huan
dc.contributor.authorLi, Hongkai
dc.contributor.authorWen, Huimin
dc.contributor.authorZhao, Xingyan
dc.contributor.authorAbedini-Nassab, Roozbeh
dc.contributor.authorSha, Gang
dc.contributor.authorYue, Fangyu
dc.contributor.authorDan, Yaping
dc.date.accessioned2023-01-11T16:24:22Z
dc.date.available2024-01-11 11:24:20en
dc.date.available2023-01-11T16:24:22Z
dc.date.issued2022-12
dc.identifier.citationWang, Xiaoming; He, Jiajing; Jin, Shenbao; Liu, Huan; Li, Hongkai; Wen, Huimin; Zhao, Xingyan; Abedini-Nassab, Roozbeh; Sha, Gang; Yue, Fangyu; Dan, Yaping (2022). "Fluorine-Enhanced Room Temperature Luminescence of Er-Doped Crystalline Silicon." Advanced Photonics Research 3(12): n/a-n/a.
dc.identifier.issn2699-9293
dc.identifier.issn2699-9293
dc.identifier.urihttps://hdl.handle.net/2027.42/175457
dc.publisherWiley Periodicals, Inc.
dc.subject.otherAuger recombination
dc.subject.otherthermal quenching
dc.subject.othersilicon-based light source
dc.subject.otherlight emission devices
dc.subject.otherEr-doped Si
dc.titleFluorine-Enhanced Room Temperature Luminescence of Er-Doped Crystalline Silicon
dc.typeArticle
dc.rights.robotsIndexNoFollow
dc.subject.hlbsecondlevelPhysics
dc.subject.hlbtoplevelScience
dc.description.peerreviewedPeer Reviewed
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/175457/1/adpr202200115-sup-0001-SuppData-S1.pdf
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/175457/2/adpr202200115.pdf
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/175457/3/adpr202200115_am.pdf
dc.identifier.doi10.1002/adpr.202200115
dc.identifier.sourceAdvanced Photonics Research
dc.identifier.citedreferenceD. Eaglesham, J. Michel, E. Fitzgerald, D. Jacobson, J. Poate, J. Benton, A. Polman, Y. H. Xie, L. Kimerling, Appl. Phys. Lett. 1991, 58, 2797.
dc.identifier.citedreferenceH. Subbaraman, X. Xu, A. Hosseini, X. Zhang, Y. Zhang, D. Kwong, R. T. Chen, Opt. Express 2015, 23, 2487.
dc.identifier.citedreferenceR. A. Soref, Proc. IEEE 1993, 81, 1687.
dc.identifier.citedreferenceR. Soref, Adv. Opt. Technol. 2008, 2008, 1.
dc.identifier.citedreferenceT. Wang, J.-J. Zhang, L. Huiyun, Acta Phys. Sin. 2015, 64, 204209.
dc.identifier.citedreferenceS. Takagi, R. Zhang, J. Suh, S.-H. Kim, M. Yokoyama, K. Nishi, M. Takenaka, Jpn. J. Appl. Phys. 2015, 54, 06FA01.
dc.identifier.citedreferenceY. B. Bolkhovityanov, O. P. Pchelyakov, Phys. Usp. 2008, 51, 437.
dc.identifier.citedreferenceT. Komljenovic, M. Davenport, J. Hulme, A. Y. Liu, C. T. Santis, A. Spott, S. Srinivasan, E. J. Stanton, C. Zhang, J. E. Bowers, J. Lightwave Technol. 2016, 34, 20.
dc.identifier.citedreferenceF. A. W. Koch, B. R. Cohen, Opt. Express 2007, 15, 11225.
dc.identifier.citedreferenceR. E. Camacho-Aguilera, Y. Cai, N. Patel, J. T. Bessette, M. Romagnoli, L. C. Kimerling, J. Michel, Opt. Express 2012, 20, 11316.
dc.identifier.citedreferenceZ. Zhou, B. Yin, J. Michel, Light: Sci. Appl. 2015, 4, 358.
dc.identifier.citedreferenceA. J. Kenyon, Semicond. Sci. Technol. 2005, 20, R65.
dc.identifier.citedreferenceA. Polman, J. Appl. Phys. 1997, 84, 1.
dc.identifier.citedreferenceH. Ennen, G. Pomrenke, A. Axmann, K. Eisele, W. Haydl, J. Schneider, Appl. Phys. Lett. 1985, 46, 381.
dc.identifier.citedreferenceH. Ennen, J. Schneider, G. Pomrenke, A. Axmann, Appl. Phys. Lett. 1983, 43, 943.
dc.identifier.citedreferenceM. A. Lourenco, M. M. Milosevic, A. Gorin, R. M. Gwilliam, K. P. Homewood, Sci. Rep. 2016, 5, 37501.
dc.identifier.citedreferenceF. Priolo, G. Franz�, S. Coffa, A. Carnera, Phys. Rev. B 1998, 57, 4443.
dc.identifier.citedreferenceH. Wen, J. He, J. Hong, S. Jin, Z. Xu, H. Zhu, J. Liu, G. Sha, F. Yue, Y. Dan, Adv. Opt. Mater. 2020, 8, 2000720.
dc.identifier.citedreferenceJ. Michel, J. L. Benton, R. F. Ferrante, D. C. Jacobson, D. J. Eaglesham, E. A. Fitzgerald, Y. H. Xie, J. M. Poate, L. C. Kimerling, J. Appl. Phys. 1991, 70, 2672.
dc.identifier.citedreferenceH. Efeoglu, J. Evans, T. Jackman, B. Hamilton, D. Houghton, J. Langer, A. Peaker, D. Perovic, I. Poole, N. Ravel, Semicond. Sci. Technol. 1993, 8, 236.
dc.identifier.citedreferenceG. Van den Hoven, J. H. Shin, A. Polman, S. Lombardo, S. Campisano, J. Appl. Phys. 1995, 78, 2642.
dc.identifier.citedreferenceF. Priolo, G. Franz�, S. Coffa, A. Polman, S. Libertino, R. Barklie, D. Carey, J. Appl. Phys. 1995, 78, 3874.
dc.identifier.citedreferenceX. H. Zhang, S. J. Chua, A. M. Yong, H. Y. Yang, S. P. Lau, S. F. Yu, X. W. Sun, L. Miao, M. Tanemura, S. Tanemura, Appl. Phys. Lett. 2007, 90, 013107.
dc.identifier.citedreferenceB. Ghosh, M. Takeguchi, J. Nakamura, Y. Nemoto, T. Hamaoka, S. Chandra, N. Shirahata, Sci. Rep. 2016, 6, 36951.
dc.identifier.citedreferenceH. C. Sio, D. Kang, R. Liu, J. Stuckelberger, C. Samundsett, D. Macdonald, ACS Appl. Mater. Interfaces 2021, 13, 32503.
dc.identifier.citedreferenceY. Liu, M. R. Halfmoon, C. A. Rittenhouse, S. Wang, Appl. Phys. Lett. 2010, 97, 242111.
dc.identifier.citedreferenceF. Ren, J. Michel, D. Jacobson, J. Poate, L. Kimerling, MRS Online Proc. Lib. (OPL) 1993, 316, 493.
dc.identifier.citedreferenceP. Liu, J. P. Zhang, R. J. Wilson, G. Curello, S. S. Rao, P. L. F. Hemment, Appl. Phys. Lett. 1995, 66, 3158.
dc.identifier.citedreferenceX. D. Pi, C. P. Burrows, P. G. Coleman, Phys. Rev. Lett. 2003, 90, 155901.
dc.identifier.citedreferenceS. P. Jeng, T. P. Ma, R. Canteri, M. Anderle, G. W. Rubloff, Appl. Phys. Lett. 1992, 61, 1310.
dc.identifier.citedreferenceA. H. Atabaki, S. Moazeni, F. Pavanello, H. Gevorgyan, J. Notaros, L. Alloatti, M. T. Wade, C. Sun, S. A. Kruger, H. Meng, K. Al Qubaisi, I. Wang, B. Zhang, A. Khilo, C. V. Baiocco, M. A. Popovic, V. M. Stojanovic, R. J. Ram, Nature 2018, 556, 349.
dc.identifier.citedreferenceR. Won, Nat. Photonics 2010, 4, 498.
dc.working.doiNOen
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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