Characterization of Two-Dimensional High Frequency Microstrip and Dielectric Interconnects.

Van Deventer, Tahera Emilie

Characterization of Two-Dimensional High Frequency Microstrip and Dielectric Interconnects.

dc.contributor.author	Van Deventer, Tahera Emilie	en_US
dc.date.accessioned	2006-02-17T19:30:22Z
dc.date.available	2006-02-17T19:30:22Z
dc.date.issued	1992-06	en_US
dc.identifier.uri	https://hdl.handle.net/2027.42/21050
dc.format.extent	408782 bytes
dc.format.extent	16897902 bytes
dc.format.extent	2970 bytes
dc.format.mimetype	text/plain
dc.format.mimetype	application/pdf
dc.format.mimetype	text/plain
dc.language	eng	en_US
dc.language.iso	en_US
dc.publisher	University of Michigan. Radiation Laboratory	en_US
dc.title	Characterization of Two-Dimensional High Frequency Microstrip and Dielectric Interconnects.	en_US
dc.type	Technical Report	en_US
dc.subject.hlbtoplevel	Engineering	en_US
dc.description.bitstreamurl	http://deepblue.lib.umich.edu/bitstream/2027.42/21050/2/rl0888.0001.001.pdf	en_US
dc.description.bitstreamurl	http://deepblue.lib.umich.edu/bitstream/2027.42/21050/1/rl0888.0001.001.txt	en_US
dc.owningcollname	Engineering, College of - Technical Reports

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