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A 75-110 GHz On Wafer Vector Network Analyzer for Electronic Device Metrology
dc.contributor.authorKatehi, Linda P. B.en_US
dc.contributor.authorRebeiz, Gabriel M.en_US
dc.contributor.authorEast Jacken_US
dc.date.accessioned2006-02-17T19:46:29Z
dc.date.available2006-02-17T19:46:29Z
dc.date.issued1996-01en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/21476
dc.format.extent16627 bytes
dc.format.extent1322795 bytes
dc.format.extent2970 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.languageengen_US
dc.language.isoen_US
dc.publisherUniversity of Michigan. Radiation Laboratoryen_US
dc.titleA 75-110 GHz On Wafer Vector Network Analyzer for Electronic Device Metrologyen_US
dc.typeTechnical Reporten_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/21476/2/rl2453.0001.001.pdfen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/21476/1/rl2453.0001.001.txten_US
dc.owningcollnameEngineering, College of - Technical Reports


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