Response of plastic scintillator detectors to heavy ions, Z E <= 170 MeV
dc.contributor.author | Becchetti, Fredrick D. | en_US |
dc.contributor.author | Thorn, C. E. | en_US |
dc.contributor.author | Levine, M. J. | en_US |
dc.date.accessioned | 2006-04-07T16:25:27Z | |
dc.date.available | 2006-04-07T16:25:27Z | |
dc.date.issued | 1976-10-01 | en_US |
dc.identifier.citation | Becchetti, F. D., Thorn, C. E., Levine, M. J. (1976/10/01)."Response of plastic scintillator detectors to heavy ions, Z E <= 170 MeV." Nuclear Instruments and Methods 138(1): 93-104. <http://hdl.handle.net/2027.42/21662> | en_US |
dc.identifier.uri | http://www.sciencedirect.com/science/article/B73DN-471XS73-1C7/2/fd4fb8ec62564998c8367c179536687a | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/21662 | |
dc.description.abstract | The fluorescent response, L, of plastic scintillators such as NE102 has been measured for a variety of heavy ions, Z = 1-35, at near-normal incidence with energies ranging from a few MeV to over a hundred MeV. The response in general is non-linear with L [is proportial to] f(Z, A)E1.6 in the region E/A R, with L [is proportial to] Z1.22 (R-0.04 Z), where R is in mg/cm2. Such an expression also appears to describe the response of other scintillators, such as NaI(Tl), for heavy ions. Scintillation efficiency, dL/dE, and specific fluorescence, dL/dx, have been deduced from the plastic scintillator data. These quantities do not appear to be simple functions of the ion energy loss, dE/dx. The results can be described using simple models which include the effects of secondary electrons, however. | en_US |
dc.format.extent | 978990 bytes | |
dc.format.extent | 3118 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.language.iso | en_US | |
dc.publisher | Elsevier | en_US |
dc.title | Response of plastic scintillator detectors to heavy ions, Z E <= 170 MeV | en_US |
dc.type | Article | en_US |
dc.rights.robots | IndexNoFollow | en_US |
dc.subject.hlbsecondlevel | Nuclear Engineering and Radiological Sciences | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Engineering | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Physics Department, The University of Michigan, Ann Arbor, Michigan 48109, U.S.A.; Physics Department, Brookhaven National Laboratory, Upton, New York 11973, U.S.A. | en_US |
dc.contributor.affiliationum | Physics Department, The University of Michigan, Ann Arbor, Michigan 48109, U.S.A. | en_US |
dc.contributor.affiliationum | Physics Department, The University of Michigan, Ann Arbor, Michigan 48109, U.S.A. | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/21662/1/0000049.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1016/0029-554X(76)90154-3 | en_US |
dc.identifier.source | Nuclear Instruments and Methods | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
Files in this item
Remediation of Harmful Language
The University of Michigan Library aims to describe its collections in a way that respects the people and communities who create, use, and are represented in them. We encourage you to Contact Us anonymously if you encounter harmful or problematic language in catalog records or finding aids. More information about our policies and practices is available at Remediation of Harmful Language.
Accessibility
If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.