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Material properties and optical guiding in InGaAs-GaAs strained layer superlattices--a brief review

dc.contributor.authorBhattacharya, Pallab K.en_US
dc.contributor.authorDas, Utpalen_US
dc.contributor.authorJuang, Feng‐Yuhen_US
dc.contributor.authorNashimoto, Yasunobuen_US
dc.contributor.authorDhar, Sunandaen_US
dc.date.accessioned2006-04-07T19:35:02Z
dc.date.available2006-04-07T19:35:02Z
dc.date.issued1986-02en_US
dc.identifier.citationBhattacharya, Pallab K., Das, Utpal, Juang, F. Y., Nashimoto, Yasunobu, Dhar, Sunanda (1986/02)."Material properties and optical guiding in InGaAs-GaAs strained layer superlattices--a brief review." Solid-State Electronics 29(2): 261-267. <http://hdl.handle.net/2027.42/26280>en_US
dc.identifier.urihttp://www.sciencedirect.com/science/article/B6TY5-46VDT3G-N0/2/482b60d19d0c0961edcbaaaace778bfden_US
dc.identifier.urihttps://hdl.handle.net/2027.42/26280
dc.description.abstractDue to the absence of lattice-matching requirements, strained-layer superlattices offer a large tunability in bandgap and other material properties suitable for device applications. Encouraging progress has been made in the molecular-beam epitaxial and metalorganic-vapor-phase-epitaxial growth of strained-layer superlattices and in their characterization. These have been briefly reviewed here. Since a strained-layer superlattice allows the use of InxGa1-xAs layers with x-values up to ~ 1.0, a large variation of the refractive index from that in GaAs occurs due to mismatch strain and alloying. This variation in refractive index has been calculated. The increase in refractive index can be used to form optical guides in the SLS and such guides with good vertical confinement is demonstrated. Preliminary measurements of the impact-ionization parameters and deep-level traps in these materials are also reported. [alpha]/[beta] values close to and slightly greater than unity are measured. A single electron trap with thermal activation energy equal to 0.16 eV is identified.en_US
dc.format.extent730205 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherElsevieren_US
dc.titleMaterial properties and optical guiding in InGaAs-GaAs strained layer superlattices--a brief reviewen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelElectrical Engineeringen_US
dc.subject.hlbtoplevelScienceen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumSolid State Electronics Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109, U.S.A.en_US
dc.contributor.affiliationumSolid State Electronics Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109, U.S.A.en_US
dc.contributor.affiliationumSolid State Electronics Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109, U.S.A.en_US
dc.contributor.affiliationumSolid State Electronics Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109, U.S.A.en_US
dc.contributor.affiliationumSolid State Electronics Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109, U.S.A.en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/26280/1/0000365.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1016/0038-1101(86)90049-3en_US
dc.identifier.sourceSolid-State Electronicsen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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