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Structural fluctuations and randomness in GaAs---AlxGa1-xAs superlattices
dc.contributor.authorClarke, Royen_US
dc.contributor.authorMoustakas, T.en_US
dc.contributor.authorBajema, K.en_US
dc.contributor.authorGrier, D.en_US
dc.contributor.authorDos Passos, Waldemaren_US
dc.contributor.authorMerlin, R.en_US
dc.date.accessioned2006-04-07T20:31:53Z
dc.date.available2006-04-07T20:31:53Z
dc.date.issued1988en_US
dc.identifier.citationClarke, Roy, Moustakas, T., Bajema, K., Grier, D., Dos Passos, W., Merlin, R. (1988)."Structural fluctuations and randomness in GaAs---AlxGa1-xAs superlattices." Superlattices and Microstructures 4(3): 371-374. <http://hdl.handle.net/2027.42/27551>en_US
dc.identifier.urihttp://www.sciencedirect.com/science/article/B6WXB-4951GHB-FB/2/88cf2f9840cc36e7988b1e8675be1baeen_US
dc.identifier.urihttps://hdl.handle.net/2027.42/27551
dc.description.abstractWe discuss the use of X-ray and Raman scattering to probe structural disorder in aperiodic GaAs---AlxGa1-xAs superlattices, including random and quasiperiodic examples. Evidence is found for the presence of monolayer-thick steps at the interfaces. The X-ray data appear far more sensitive to this type of disorder than the acoustic phonon spectra obtained by Raman scattering.en_US
dc.format.extent363554 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherElsevieren_US
dc.titleStructural fluctuations and randomness in GaAs---AlxGa1-xAs superlatticesen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelMathematicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumUniversity of Michigan, Ann Arhor, MI 48109-1120, USAen_US
dc.contributor.affiliationumUniversity of Michigan, Ann Arhor, MI 48109-1120, USAen_US
dc.contributor.affiliationumUniversity of Michigan, Ann Arhor, MI 48109-1120, USAen_US
dc.contributor.affiliationumUniversity of Michigan, Ann Arhor, MI 48109-1120, USAen_US
dc.contributor.affiliationotherExxon Research and Engineering Company Annandale, NJ 08801, USAen_US
dc.contributor.affiliationotherExxon Research and Engineering Company, Annandale, NJ 08801, USAen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/27551/1/0000595.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1016/0749-6036(88)90184-Xen_US
dc.identifier.sourceSuperlattices and Microstructuresen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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