Structural fluctuations and randomness in GaAs---AlxGa1-xAs superlattices
dc.contributor.author | Clarke, Roy | en_US |
dc.contributor.author | Moustakas, T. | en_US |
dc.contributor.author | Bajema, K. | en_US |
dc.contributor.author | Grier, D. | en_US |
dc.contributor.author | Dos Passos, Waldemar | en_US |
dc.contributor.author | Merlin, R. | en_US |
dc.date.accessioned | 2006-04-07T20:31:53Z | |
dc.date.available | 2006-04-07T20:31:53Z | |
dc.date.issued | 1988 | en_US |
dc.identifier.citation | Clarke, Roy, Moustakas, T., Bajema, K., Grier, D., Dos Passos, W., Merlin, R. (1988)."Structural fluctuations and randomness in GaAs---AlxGa1-xAs superlattices." Superlattices and Microstructures 4(3): 371-374. <http://hdl.handle.net/2027.42/27551> | en_US |
dc.identifier.uri | http://www.sciencedirect.com/science/article/B6WXB-4951GHB-FB/2/88cf2f9840cc36e7988b1e8675be1bae | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/27551 | |
dc.description.abstract | We discuss the use of X-ray and Raman scattering to probe structural disorder in aperiodic GaAs---AlxGa1-xAs superlattices, including random and quasiperiodic examples. Evidence is found for the presence of monolayer-thick steps at the interfaces. The X-ray data appear far more sensitive to this type of disorder than the acoustic phonon spectra obtained by Raman scattering. | en_US |
dc.format.extent | 363554 bytes | |
dc.format.extent | 3118 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.language.iso | en_US | |
dc.publisher | Elsevier | en_US |
dc.title | Structural fluctuations and randomness in GaAs---AlxGa1-xAs superlattices | en_US |
dc.type | Article | en_US |
dc.rights.robots | IndexNoFollow | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbsecondlevel | Mathematics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | University of Michigan, Ann Arhor, MI 48109-1120, USA | en_US |
dc.contributor.affiliationum | University of Michigan, Ann Arhor, MI 48109-1120, USA | en_US |
dc.contributor.affiliationum | University of Michigan, Ann Arhor, MI 48109-1120, USA | en_US |
dc.contributor.affiliationum | University of Michigan, Ann Arhor, MI 48109-1120, USA | en_US |
dc.contributor.affiliationother | Exxon Research and Engineering Company Annandale, NJ 08801, USA | en_US |
dc.contributor.affiliationother | Exxon Research and Engineering Company, Annandale, NJ 08801, USA | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/27551/1/0000595.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1016/0749-6036(88)90184-X | en_US |
dc.identifier.source | Superlattices and Microstructures | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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