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External electro-optic integrated circuit probing

dc.contributor.authorWhitaker, John F.en_US
dc.contributor.authorValdmanis, J. A.en_US
dc.contributor.authorFrankel, M. Y.en_US
dc.contributor.authorGupta, S.en_US
dc.contributor.authorChwalek, J. M.en_US
dc.contributor.authorMourou, Gerard A.en_US
dc.date.accessioned2006-04-10T13:45:26Z
dc.date.available2006-04-10T13:45:26Z
dc.date.issued1990-05en_US
dc.identifier.citationWhitaker, J. F., Valdmanis, J. A., Frankel, M. Y., Gupta, S., Chwalek, J. M., Mourou, G. A. (1990/05)."External electro-optic integrated circuit probing." Microelectronic Engineering 12(1-4): 369-379. <http://hdl.handle.net/2027.42/28606>en_US
dc.identifier.urihttp://www.sciencedirect.com/science/article/B6V0W-46K4P0M-3J/2/90a47131ddeb8d6e0887adb78b5ed46aen_US
dc.identifier.urihttps://hdl.handle.net/2027.42/28606
dc.description.abstractAn external electro-optic measurement system with subpicosecond resolution has been developed. This electro-optic sampling system is designed to operate as a non-contact probe of voltages in electrical devices and circuits with modified wafer-level test equipment and no special circuit preparation. Measurements demonstrate the system's ability to probe continuous and pulsed signals on microwave integrated circuits on arbitrary substrates with single-micron spatial resolution. We also discuss the application of external electro-optic sampling to various aspects of time-domain circuit studies, including the generation of short electrical test pulses using novel photoconductive techniques and the propagation of pulses on interconnects.en_US
dc.format.extent703466 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherElsevieren_US
dc.titleExternal electro-optic integrated circuit probingen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelElectrical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumUltrafast Science Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122, USAen_US
dc.contributor.affiliationumUltrafast Science Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122, USAen_US
dc.contributor.affiliationumUltrafast Science Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122, USAen_US
dc.contributor.affiliationumUltrafast Science Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122, USAen_US
dc.contributor.affiliationumUltrafast Science Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122, USAen_US
dc.contributor.affiliationumUltrafast Science Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122, USAen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/28606/1/0000415.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1016/0167-9317(90)90050-4en_US
dc.identifier.sourceMicroelectronic Engineeringen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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