Electromagnetic scattering from a resistive half plane on a dielectric interface

Abstract

The dual integral equation approach is employed to determine the diffracted field from a resistive half plane on a dielectric interface. A solution is obtained by introducing two Wiener-Hopf split functions, one being inherent to the dielectric interface problem and the other characteristic to the presence of the resistive sheet. Uniform asymptotic expressions for the E- and H-polarizations are given (with the exception of the branch cut contribution), and numerical computations are included for the far-zone and near-zone fields. Also, a convenient integral expression is given in the Appendix for the evaluation of the split functions.