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Structural imaging of a thick-walled carbon microtubule

dc.contributor.authorBretz, Michaelen_US
dc.contributor.authorDemczyk, Brian G.en_US
dc.contributor.authorZhang, Luqunen_US
dc.date.accessioned2006-04-10T17:58:32Z
dc.date.available2006-04-10T17:58:32Z
dc.date.issued1994-08-01en_US
dc.identifier.citationBretz, Michael, Demczyk, Brian G., Zhang, Luqun (1994/08/01)."Structural imaging of a thick-walled carbon microtubule." Journal of Crystal Growth 141(1-2): 304-309. <http://hdl.handle.net/2027.42/31407>en_US
dc.identifier.urihttp://www.sciencedirect.com/science/article/B6TJ6-46MKVPV-41/2/3baaefe4f1bff52a43fae5cc8c9dd8b3en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/31407
dc.description.abstractWe analyze the structure of a thick-walled carbon microtubule based on direct electron beam imaging of the graphitic cylinders comprising the fiber. Clearly resolved six-fold symmetry of basal planes overlying the fiber core indicate zero overall fiber helicity and alignment of individual cylinders. Sidewall measurements calibrated from the {100} core fringes show uniform spacings of about 0.375 nm, which are larger than those reported for other microtubules or for crystalline graphite (0.335 nm). Short zones of local 3o helicity are observed along the fiber. Structural transitions which alter the helicity are characterized by extra atomic planes and other defects, including nested sub-tubules. We discuss implications for the fiber's growth and electrical properties.en_US
dc.format.extent1272724 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherElsevieren_US
dc.titleStructural imaging of a thick-walled carbon microtubuleen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelMathematicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Physics, University of Michigan, Ann Arbor, Michigan 48109, USAen_US
dc.contributor.affiliationumElectron Microbeam Analysis Laboratory, University of Michigan, Ann Arbor, Michigan 48109, USAen_US
dc.contributor.affiliationumDepartment of Physics, University of Michigan, Ann Arbor, Michigan 48109, USAen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/31407/1/0000324.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1016/0022-0248(94)90124-4en_US
dc.identifier.sourceJournal of Crystal Growthen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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