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Low-temperature silicon wafer-to-wafer bonding using gold at eutectic temperature

dc.contributor.authorWolffenbuttel, R. F.en_US
dc.contributor.authorWise, K. D. (Kensall D.)en_US
dc.date.accessioned2006-04-10T18:10:58Z
dc.date.available2006-04-10T18:10:58Z
dc.date.issued1994-05en_US
dc.identifier.citationWolffenbuttel, R. F., Wise, K. D. (1994/05)."Low-temperature silicon wafer-to-wafer bonding using gold at eutectic temperature." Sensors and Actuators A: Physical 43(1-3): 223-229. <http://hdl.handle.net/2027.42/31608>en_US
dc.identifier.urihttp://www.sciencedirect.com/science/article/B6THG-448R94P-1B/2/26d3277f4abfd9eb08abeadc39a45c66en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/31608
dc.description.abstractMicromechanical smart sensor and actuator systems of high complexity become commercially viable when realized as a multi-wafer device in which the mechanical functions are distributed over different wafers and one of the wafers is dedicated to contain the readout circuits. The individually-processed wafers can be assembled using wafer-to-wafer bonding and can be combined to one single functional electro-mechanical unit using through-wafer interconnect, provided that the processes involved comply with the constraints imposed by the proper operation of the active electrical and micromechanical subsystems. This implies low-temperature wafer-to-wafer bonding and through-wafer interconnect. Au/Si eutectic bonding has been investigated as it can conveniently be combined with bulk-micromachined through-wafer interconnect. The temperature control in eutectic bonding has been shown to be critical.en_US
dc.format.extent836466 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherElsevieren_US
dc.titleLow-temperature silicon wafer-to-wafer bonding using gold at eutectic temperatureen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelMechanical Engineeringen_US
dc.subject.hlbsecondlevelIndustrial and Operations Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCenter for Integrated Sensors and Circuits, Solid-state Electronics Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI, USA.en_US
dc.contributor.affiliationotherLaboratory for Electronic Instrumentation, Department of Electrical Engineering, Delft University of Technology, Mekelweg 4, 2628 CD Delft Netherlandsen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/31608/1/0000537.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1016/0924-4247(93)00653-Len_US
dc.identifier.sourceSensors and Actuators A: Physicalen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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