X-ray microscopy by successive fourier transformation

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dc.contributor.author Winthrop, J. T. en_US
dc.contributor.author Worthington, C. R. en_US
dc.date.accessioned 2006-04-13T14:43:31Z
dc.date.available 2006-04-13T14:43:31Z
dc.date.issued 1965-03-15 en_US
dc.identifier.citation Winthrop, J. T., Worthington, C. R. (1965/03/15)."X-ray microscopy by successive fourier transformation." Physics Letters 15(2): 124-126. <http://hdl.handle.net/2027.42/32040> en_US
dc.identifier.uri http://www.sciencedirect.com/science/article/B6X44-47DC027-5M/2/60d05e5177fa911b066d417589f5ba66 en_US
dc.identifier.uri http://hdl.handle.net/2027.42/32040
dc.format.extent 323062 bytes
dc.format.extent 3118 bytes
dc.format.mimetype application/pdf
dc.format.mimetype text/plain
dc.language.iso en_US
dc.publisher Elsevier en_US
dc.title X-ray microscopy by successive fourier transformation en_US
dc.type Article en_US
dc.rights.robots IndexNoFollow en_US
dc.subject.hlbsecondlevel Physics en_US
dc.subject.hlbsecondlevel Mathematics en_US
dc.subject.hlbtoplevel Science en_US
dc.description.peerreviewed Peer Reviewed en_US
dc.contributor.affiliationum Department of Physics, University of Michigan, Ann Arbor, Michigan, USA en_US
dc.contributor.affiliationum Department of Physics, University of Michigan, Ann Arbor, Michigan, USA en_US
dc.description.bitstreamurl http://deepblue.lib.umich.edu/bitstream/2027.42/32040/1/0000083.pdf en_US
dc.identifier.doi http://dx.doi.org/10.1016/0031-9163(65)91304-1 en_US
dc.identifier.source Physics Letters en_US
dc.owningcollname Interdisciplinary and Peer-Reviewed
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