Show simple item record

Calculated gamma ray response characteristics of semiconductor detectors

dc.contributor.authorWainio, K. M.en_US
dc.contributor.authorKnoll, Glenn F.en_US
dc.date.accessioned2006-04-17T16:14:59Z
dc.date.available2006-04-17T16:14:59Z
dc.date.issued1966-10en_US
dc.identifier.citationWainio, K. M., Knoll, G. F. (1966/10)."Calculated gamma ray response characteristics of semiconductor detectors." Nuclear Instruments and Methods 44(2): 213-223. <http://hdl.handle.net/2027.42/33414>en_US
dc.identifier.urihttp://www.sciencedirect.com/science/article/B73DN-470WDSP-1V7/2/69959619020cfb08eed4581a62145162en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/33414
dc.description.abstractA Monte Carlo computer program has been used to calculate characteristics of the response of fully depleted silicon and germanium radiation detectors to monoenergetic gamma rays. Data for total absorption probability, intrinsic efficiency, escape peak efficiency and pulse height spectra are presented as functions of detector thickness and photon energy. Other parameters of interest in analysing detector response are also given. The results of a second Monte Carlo calculation of electron migration in silicon and germanium are employed to account for the leakage of secondary electrons from the detector volume. Bremsstrahlung energy loss by electrons is also simulated. The calculations are expected to be applicable in those cases in which secondary electron energies do not exceed 2 MeV. Comparison with experiment shows good agreement within this limitation.en_US
dc.format.extent728819 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherElsevieren_US
dc.titleCalculated gamma ray response characteristics of semiconductor detectorsen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelNuclear Engineering and Radiological Sciencesen_US
dc.subject.hlbtoplevelScienceen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Nuclear Engineering, The University of Michigan, Ann Arbor, Michigan, USAen_US
dc.contributor.affiliationumDepartment of Nuclear Engineering, The University of Michigan, Ann Arbor, Michigan, USAen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/33414/1/0000815.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1016/0029-554X(66)90153-4en_US
dc.identifier.sourceNuclear Instruments and Methodsen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.