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X-ray microscopy by successive Fourier transformation II. An optical analogue experiment

dc.contributor.authorWinthrop, J. T.en_US
dc.contributor.authorWorthington, C. R.en_US
dc.date.accessioned2006-04-17T16:16:22Z
dc.date.available2006-04-17T16:16:22Z
dc.date.issued1966-06-01en_US
dc.identifier.citationWinthrop, J. T., Worthington, C. R. (1966/06/01)."X-ray microscopy by successive Fourier transformation II. An optical analogue experiment." Physics Letters 21(4): 413-415. <http://hdl.handle.net/2027.42/33445>en_US
dc.identifier.urihttp://www.sciencedirect.com/science/article/B6X44-46M7MPG-YG/2/43c9059b31b123365fc7c709f4408a47en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/33445
dc.description.abstractAn optical analogue experiment related to a method of X-ray microscopy by successive Fourier transformation is described. Some experimental design features are discussed.en_US
dc.format.extent216930 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherElsevieren_US
dc.titleX-ray microscopy by successive Fourier transformation II. An optical analogue experimenten_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelMathematicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Physics, University of Michigan, Ann Arbor, Michigan 48104, USAen_US
dc.contributor.affiliationumDepartment of Physics, University of Michigan, Ann Arbor, Michigan 48104, USAen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/33445/1/0000848.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1016/0031-9163(66)90510-5en_US
dc.identifier.sourcePhysics Lettersen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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