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Error matrices in gas-electron diffraction : I. Effects of systematic errors in intensities

dc.contributor.authorBartell, Lawrence S.en_US
dc.contributor.authorYow, Hsiukang Yuen_US
dc.date.accessioned2006-04-17T16:42:33Z
dc.date.available2006-04-17T16:42:33Z
dc.date.issued1973-02en_US
dc.identifier.citationBartell, L. S., Yow, Hsiukang (1973/02)."Error matrices in gas-electron diffraction : I. Effects of systematic errors in intensities." Journal of Molecular Structure 15(2): 173-188. <http://hdl.handle.net/2027.42/33952>en_US
dc.identifier.urihttp://www.sciencedirect.com/science/article/B6TGS-44KR4P1-NB/2/46e44b2fa1d03e575075f065dc4cc500en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/33952
dc.description.abstractElectron diffractionists have largely ignored the effect of systematic errors in intensities upon derived molecular parameters. The present investigation proposes a treatment of such errors in terms of certain coefficients characterizing systematic errors which are included as variables interacting with molecular parameters in the information matrix. A simple method is devised to limit coefficient variances to reasonable values. Simple analytical approximations are derived to account for parameter regression slopes. Model systems with poorly resolved internuclear distances are tested. It is found that systematic errors may have a substantial effect, particularly in the case of amplitudes of vibration and the resolution of closely similar internuclear distances. Different types of vibrational averages [e.g., rg(0) versus rg(1)] are influenced to different extents. The resolution of internuclear distances is influenced less by systematic errors if the internuclear distances correspond to atomic scattering factors with distinctly different angular dependencies. Investigations in which a knowledge of highly correlated parameters is crucial should include a treatment analogous to that proposed above.en_US
dc.format.extent1224855 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherElsevieren_US
dc.titleError matrices in gas-electron diffraction : I. Effects of systematic errors in intensitiesen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelMaterials Science and Engineeringen_US
dc.subject.hlbsecondlevelChemistryen_US
dc.subject.hlbsecondlevelChemical Engineeringen_US
dc.subject.hlbtoplevelScienceen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Chemistry, University of Michigan, Ann Arbor, Mich. 48104 U.S.A.en_US
dc.contributor.affiliationumDepartment of Chemistry, University of Michigan, Ann Arbor, Mich. 48104 U.S.A.en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/33952/1/0000222.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1016/0022-2860(73)85001-Xen_US
dc.identifier.sourceJournal of Molecular Structureen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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