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Modelling of dielectric cavity structures using multiresolution time-domain analysis
dc.contributor.authorRobertson, Roben_US
dc.contributor.authorTentzeris, Emmanouil M.en_US
dc.contributor.authorKrumpholz, Michaelen_US
dc.contributor.authorKatehi, Linda P. B.en_US
dc.date.accessioned2006-04-19T14:05:14Z
dc.date.available2006-04-19T14:05:14Z
dc.date.issued1998-01en_US
dc.identifier.citationRobertson, Rob; Tentzeris, Emmanouil; Krumpholz, Michael; Katehi, Linda P. B. (1998)."Modelling of dielectric cavity structures using multiresolution time-domain analysis." International Journal of Numerical Modelling: Electronic Networks, Devices and Fields 11(1): 55-68. <http://hdl.handle.net/2027.42/35031>en_US
dc.identifier.issn0894-3370en_US
dc.identifier.issn1099-1204en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/35031
dc.description.abstractMultiresolution time domain (MRTD) analysis is applied directly to Maxwell’s equations to model inhomogeneous dielectric material. In our approach, scaling and wavelet functions are used as a complete basis for the method of moments. The MRTD scheme is used to analyze different types of resonant cavity structures with varying dielectric perturbations in one, two and three dimensions. The results presented here agree very well with those obtained by FDTD, FEM and integral equation methods. MRTD allows for considerable savings in memory and computation time in comparison to FDTD, while maintaining the same accuracy of the results. © 1998 John Wiley & Sons, Ltd.en_US
dc.format.extent236501 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherJohn Wiley & Sons, Ltd.en_US
dc.subject.otherEngineeringen_US
dc.subject.otherNumerical Methods and Modelingen_US
dc.titleModelling of dielectric cavity structures using multiresolution time-domain analysisen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelComputer Scienceen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumRadiation Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122, U.S.A. ; Department of Electrical Engineering and Computer Science, The University of Michigan, 3234 EECS Building, 1301 Beal Avenue, Ann Arbor, MI 48109-2122, USAen_US
dc.contributor.affiliationumRadiation Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122, U.S.A.en_US
dc.contributor.affiliationumRadiation Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122, U.S.A.en_US
dc.contributor.affiliationumRadiation Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122, U.S.A.en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/35031/1/289_ftp.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1002/(SICI)1099-1204(199801/02)11:1<55::AID-JNM289>3.0.CO;2-1en_US
dc.identifier.sourceInternational Journal of Numerical Modelling: Electronic Networks, Devices and Fieldsen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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