Perfectly matched layer termination for finite-element meshes: Implementation and application
dc.contributor.author | Botros, Youssry Y. | en_US |
dc.contributor.author | Volakis, John Leonidas | en_US |
dc.date.accessioned | 2006-04-19T14:05:58Z | |
dc.date.available | 2006-04-19T14:05:58Z | |
dc.date.issued | 1999-11-05 | en_US |
dc.identifier.citation | Botros, Youssry Y.; Volakis, John L. (1999)."Perfectly matched layer termination for finite-element meshes: Implementation and application." Microwave and Optical Technology Letters 23(3): 166-172. <http://hdl.handle.net/2027.42/35043> | en_US |
dc.identifier.issn | 0895-2477 | en_US |
dc.identifier.issn | 1098-2760 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/35043 | |
dc.description.abstract | Perfectly matched layer (PML) absorbers deteriorate the condition of the resulting finite-element sparse systems. Therefore, poor convergence scenarios are observed when an iterative solver is employed. In this work, we show that, by choosing the PML parameters in an optimal manner, substantial speedup in the solution convergence is achieved without affecting PML absorption. A robust preconditioned solver with nearly no breakdown possibilities is suggested, implemented, and tested for two microwave circuit applications. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 23: 166–172, 1999. | en_US |
dc.format.extent | 215319 bytes | |
dc.format.extent | 3118 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.language.iso | en_US | |
dc.publisher | John Wiley & Sons, Inc. | en_US |
dc.subject.other | Engineering | en_US |
dc.subject.other | Electronic, Electrical & Telecommunications Engineering | en_US |
dc.title | Perfectly matched layer termination for finite-element meshes: Implementation and application | en_US |
dc.type | Article | en_US |
dc.rights.robots | IndexNoFollow | en_US |
dc.subject.hlbsecondlevel | Electrical Engineering | en_US |
dc.subject.hlbtoplevel | Engineering | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Radiation Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109-2122 | en_US |
dc.contributor.affiliationum | Radiation Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109-2122 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/35043/1/11_ftp.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1002/(SICI)1098-2760(19991105)23:3<166::AID-MOP11>3.0.CO;2-V | en_US |
dc.identifier.source | Microwave and Optical Technology Letters | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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