Show simple item record

Perfectly matched layer termination for finite-element meshes: Implementation and application

dc.contributor.authorBotros, Youssry Y.en_US
dc.contributor.authorVolakis, John Leonidasen_US
dc.date.accessioned2006-04-19T14:05:58Z
dc.date.available2006-04-19T14:05:58Z
dc.date.issued1999-11-05en_US
dc.identifier.citationBotros, Youssry Y.; Volakis, John L. (1999)."Perfectly matched layer termination for finite-element meshes: Implementation and application." Microwave and Optical Technology Letters 23(3): 166-172. <http://hdl.handle.net/2027.42/35043>en_US
dc.identifier.issn0895-2477en_US
dc.identifier.issn1098-2760en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/35043
dc.description.abstractPerfectly matched layer (PML) absorbers deteriorate the condition of the resulting finite-element sparse systems. Therefore, poor convergence scenarios are observed when an iterative solver is employed. In this work, we show that, by choosing the PML parameters in an optimal manner, substantial speedup in the solution convergence is achieved without affecting PML absorption. A robust preconditioned solver with nearly no breakdown possibilities is suggested, implemented, and tested for two microwave circuit applications. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 23: 166–172, 1999.en_US
dc.format.extent215319 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherJohn Wiley & Sons, Inc.en_US
dc.subject.otherEngineeringen_US
dc.subject.otherElectronic, Electrical & Telecommunications Engineeringen_US
dc.titlePerfectly matched layer termination for finite-element meshes: Implementation and applicationen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelElectrical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumRadiation Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109-2122en_US
dc.contributor.affiliationumRadiation Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109-2122en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/35043/1/11_ftp.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1002/(SICI)1098-2760(19991105)23:3<166::AID-MOP11>3.0.CO;2-Ven_US
dc.identifier.sourceMicrowave and Optical Technology Lettersen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.