An extension of the array decomposition method for large finite-array analysis
dc.contributor.author | Kindt, Rick | en_US |
dc.contributor.author | Sertel, Kubilay | en_US |
dc.contributor.author | Topsakal, Erdem | en_US |
dc.contributor.author | Volakis, John Leonidas | en_US |
dc.date.accessioned | 2006-04-19T14:06:06Z | |
dc.date.available | 2006-04-19T14:06:06Z | |
dc.date.issued | 2003-08-20 | en_US |
dc.identifier.citation | Kindt, Rick; Sertel, K.; Topsakal, E.; Volakis, J. L. (2003)."An extension of the array decomposition method for large finite-array analysis." Microwave and Optical Technology Letters 38(4): 323-328. <http://hdl.handle.net/2027.42/35046> | en_US |
dc.identifier.issn | 0895-2477 | en_US |
dc.identifier.issn | 1098-2760 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/35046 | |
dc.description.abstract | In this paper, a method is presented for analyzing very large finite arrays of tapered-slot antenna elements. The Toeplitz matrix property of regularly spaced arrays, combined with a parametrically truncated coupling radius, generates fixed matrix storage based on the coupling radius rather than array size, thus allowing very large problem analysis. © 2003 Wiley Periodicals, Inc. Microwave Opt Technol Lett 38: 323–328, 2003; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.11050 | en_US |
dc.format.extent | 128769 bytes | |
dc.format.extent | 3118 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.language.iso | en_US | |
dc.publisher | Wiley Subscription Services, Inc., A Wiley Company | en_US |
dc.subject.other | Engineering | en_US |
dc.subject.other | Electronic, Electrical & Telecommunications Engineering | en_US |
dc.title | An extension of the array decomposition method for large finite-array analysis | en_US |
dc.type | Article | en_US |
dc.rights.robots | IndexNoFollow | en_US |
dc.subject.hlbsecondlevel | Electrical Engineering | en_US |
dc.subject.hlbtoplevel | Engineering | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Radiation Lab, University of Michigan, Ann Arbor, MI 48109-2122 | en_US |
dc.contributor.affiliationum | Radiation Lab, University of Michigan, Ann Arbor, MI 48109-2122 | en_US |
dc.contributor.affiliationum | Radiation Lab, University of Michigan, Ann Arbor, MI 48109-2122 | en_US |
dc.contributor.affiliationum | Radiation Lab, University of Michigan, Ann Arbor, MI 48109-2122 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/35046/1/11050_ftp.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1002/mop.11050 | en_US |
dc.identifier.source | Microwave and Optical Technology Letters | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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