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An explicit closed-form solution to the limited-angle discrete tomography problem for finite-support objects

dc.contributor.authorYagle, Andrew E.en_US
dc.date.accessioned2006-04-19T14:07:25Z
dc.date.available2006-04-19T14:07:25Z
dc.date.issued1998en_US
dc.identifier.citationYagle, Andrew E. (1998)."An explicit closed-form solution to the limited-angle discrete tomography problem for finite-support objects." International Journal of Imaging Systems and Technology 9(2–3): 174-180. <http://hdl.handle.net/2027.42/35065>en_US
dc.identifier.issn0899-9457en_US
dc.identifier.issn1098-1098en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/35065
dc.description.abstractAn explicit formula is presented for reconstructing a finite-support object defined on a lattice of points and taking on integer values from a finite number of its discrete projections over a limited range of angles. Extensive use is made of the discrete Fourier transform in doing so. The approach in this article computes the object sample values directly as a linear combination of the projections sample values. The well-known ill-posedness of the limited angle tomography problem manifests itself in some very large coefficients in these linear combinations; these coefficients (which are computed off-line) provide a direct sensitivity measure of the reconstruction samples to the projections samples. The discrete nature of the problem implies that the projections must also take on integer values; this means noise can be rejected. This makes the formula practical. © 1998 John Wiley & Sons, Inc. Int J Imaging Syst Technol, 9, 174–180, 1998en_US
dc.format.extent105731 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherJohn Wiley & Sons, Inc.en_US
dc.subject.otherEngineeringen_US
dc.subject.otherElectronic, Electrical & Telecommunications Engineeringen_US
dc.titleAn explicit closed-form solution to the limited-angle discrete tomography problem for finite-support objectsen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelElectrical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122 ; Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2122en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/35065/1/14_ftp.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1002/(SICI)1098-1098(1998)9:2/3<174::AID-IMA14>3.0.CO;2-Xen_US
dc.identifier.sourceInternational Journal of Imaging Systems and Technologyen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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