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A quantitative adhesion test for thin polymer films on silicon substrates

dc.contributor.authorGoldberg, Howard D.en_US
dc.contributor.authorCha, Geun Sigen_US
dc.contributor.authorBrown, Richard B.en_US
dc.date.accessioned2006-04-28T18:06:59Z
dc.date.available2006-04-28T18:06:59Z
dc.date.issued1991-10-05en_US
dc.identifier.citationGoldberg, H. D.; Cha, G. S.; Brown, R. B. (1991)."A quantitative adhesion test for thin polymer films on silicon substrates." Journal of Applied Polymer Science 43(7): 1287-1292. <http://hdl.handle.net/2027.42/38611>en_US
dc.identifier.issn0021-8995en_US
dc.identifier.issn1097-4628en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/38611
dc.description.abstractThe standard 90° peel test was modified in order to apply it to testing adhesion of thin polymer films to surfaces of silicon substrates, such as the silicon nitride passivation layer used in our solid-state chemical sensors. The goal of this task was to develop a procedure for testing adhesion of both dry and wet films, which would yield repeatable, quantitative results quickly, and with simple sample preparation. It is important to produce valid comparisons of adhesion both over variations of a given polymer composition, and between films made of dissimilar polymer matrices. The method described herein could be applied to adhesion testing of a wide variety of thin polymer layers to solid surfaces.en_US
dc.format.extent504811 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherWiley Subscription Services, Inc., A Wiley Companyen_US
dc.subject.otherChemistryen_US
dc.subject.otherPolymer and Materials Scienceen_US
dc.titleA quantitative adhesion test for thin polymer films on silicon substratesen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelChemical Engineeringen_US
dc.subject.hlbsecondlevelChemistryen_US
dc.subject.hlbsecondlevelManagementen_US
dc.subject.hlbsecondlevelEconomicsen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.subject.hlbtoplevelScienceen_US
dc.subject.hlbtoplevelBusinessen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science, Center for Integrated Sensors and Circuits, University of Michigan, Ann Arbor, Michigan 48109-2122en_US
dc.contributor.affiliationumChemistry Department, Center for Integrated Sensors and Circuits, University of Michigan, Ann Arbor, Michigan 48109-2122en_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science, Center for Integrated Sensors and Circuits, University of Michigan, Ann Arbor, Michigan 48109-2122 ; Department of Electrical Engineering and Computer Science, Center for Integrated Sensors and Circuits, University of Michigan, Ann Arbor, Michigan 48109-2122en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/38611/1/070430709_ftp.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1002/app.1991.070430709en_US
dc.identifier.sourceJournal of Applied Polymer Scienceen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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