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High-speed digital filtering: Structures and finite wordlength effects

dc.contributor.authorArun, K. S.en_US
dc.contributor.authorWagner, D. R.en_US
dc.date.accessioned2006-09-08T19:10:03Z
dc.date.available2006-09-08T19:10:03Z
dc.date.issued1992-11en_US
dc.identifier.citationArun, K. S.; Wagner, D. R.; (1992). "High-speed digital filtering: Structures and finite wordlength effects." Journal of VLSI Signal Processing 4(4): 355-370. <http://hdl.handle.net/2027.42/41355>en_US
dc.identifier.issn0922-5773en_US
dc.identifier.issn1573-109Xen_US
dc.identifier.urihttps://hdl.handle.net/2027.42/41355
dc.description.abstractThis paper is a study of high-throughput filter structures such as block structures and their behavior in finite precision environments. Block structures achieve high throughput rates by using a large number of processors working in parallel. It has been believed that block structures which are relatively robust to round-off noise must also be robust to coefficient quantization errors. However, our research has shown that block structures, in fact, have high coefficient sensitivity. A potential problem that arises as a result of coefficient quantization is a periodically time-varying behavior exhibited by the realized filter. We will demonstrate how finite wordlength errors can change a nominally time-invariant filter into a time-varying system. We will identify the block structures that have low coefficient sensitivity, and develop high-speed structures that are immune to the time-varying problems caused by coefficient quantization.en_US
dc.format.extent1213430 bytes
dc.format.extent3115 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherKluwer Academic Publishers; Springer Science+Business Mediaen_US
dc.subject.otherEngineeringen_US
dc.subject.otherElectronic and Computer Engineeringen_US
dc.subject.otherSignal, Image and Speech Processingen_US
dc.subject.otherCircuits and Systemsen_US
dc.titleHigh-speed digital filtering: Structures and finite wordlength effectsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelInformation and Library Scienceen_US
dc.subject.hlbsecondlevelElectrical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.subject.hlbtoplevelSocial Sciencesen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCoordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1101 W. Springfield Avenue, 61801, Urbana, IL; EECS Department, University of Michigan, 48103, Ann Arbor, MIen_US
dc.contributor.affiliationotherCoordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1101 W. Springfield Avenue, 61801, Urbana, ILen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/41355/1/11265_2004_Article_BF00930646.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1007/BF00930646en_US
dc.identifier.sourceJournal of VLSI Signal Processingen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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