Quasi-statically growing crack-tip fields in elastic perfectly plastic pressure-sensitive materials under plane strain conditions
dc.contributor.author | Chang, W. J. | en_US |
dc.contributor.author | Kim, M. | en_US |
dc.contributor.author | Pan, Jwo | en_US |
dc.date.accessioned | 2006-09-08T20:43:15Z | |
dc.date.available | 2006-09-08T20:43:15Z | |
dc.date.issued | 1997-09 | en_US |
dc.identifier.citation | Chang, W.j.; Kim, M.; Pan, J.; (1997). "Quasi-statically growing crack-tip fields in elastic perfectly plastic pressure-sensitive materials under plane strain conditions." International Journal of Fracture 84(3): 203-228. <http://hdl.handle.net/2027.42/42785> | en_US |
dc.identifier.issn | 0376-9429 | en_US |
dc.identifier.issn | 1573-2673 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/42785 | |
dc.description.abstract | Quasi-statically growing crack-tip fields in elastic perfectly plastic pressure-sensitive materials under plane strain conditions are investigated in this paper. The materials are assumed to follow the Drucker-Prager yield criterion and the normality flow rule. The asymptotic mode I crack-tip fields are assumed to follow the five-sector assembly of Drugan et al. (1982) for Mises materials. The crack-tip sectors, in turns, from the front of the crack tip are a constant stress sector, a centered fan sector, a non-singular plastic sector, an elastic sector and finally a trailing non-singular plastic sector bordering the crack face. The results of the asymptotic analysis show that as the pressure sensitivity increases, the plastic deformation shifts to the front of the tip, the angular span of the elastic unloading sector increases, and the angular span of the trailing non-singular plastic sector bordering the crack surface decreases. As the pressure sensitivity increases to about 0.6, the angular span of the trailing non-singular plastic sector almost vanishes. The effects of the border conditions between the centered fan sector and the first non-singular plastic sector on the solutions of the crack-tip fields for both Mises and pressure-sensitive materials are investigated in details. | en_US |
dc.format.extent | 230681 bytes | |
dc.format.extent | 3115 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.language.iso | en_US | |
dc.publisher | Kluwer Academic Publishers; Springer Science+Business Media | en_US |
dc.subject.other | Physics | en_US |
dc.subject.other | Mechanics | en_US |
dc.subject.other | Mechanical Engineering | en_US |
dc.subject.other | Automotive and Aerospace Engineering | en_US |
dc.subject.other | Materials Processing, Characterization, and Design | en_US |
dc.subject.other | Civil Engineering | en_US |
dc.subject.other | Asymptotic Analysis | en_US |
dc.subject.other | Growing Cracks | en_US |
dc.subject.other | Pressure Sensitivity | en_US |
dc.subject.other | Perfectly Plastic Materials | en_US |
dc.title | Quasi-statically growing crack-tip fields in elastic perfectly plastic pressure-sensitive materials under plane strain conditions | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Materials Science and Engineering | en_US |
dc.subject.hlbtoplevel | Engineering | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Mechanical Engineering and Applied Mechanics, The University of Michigan, Ann Arbor, MI, 48109, USA | en_US |
dc.contributor.affiliationum | Mechanical Engineering and Applied Mechanics, The University of Michigan, Ann Arbor, MI, 48109, USA | en_US |
dc.contributor.affiliationum | Mechanical Engineering and Applied Mechanics, The University of Michigan, Ann Arbor, MI, 48109, USA | en_US |
dc.contributor.affiliationumcampus | Ann Arbor | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/42785/1/10704_2004_Article_136416.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1023/A:1007383310367 | en_US |
dc.identifier.source | International Journal of Fracture | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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