On-Line Monitor Design of Finite-State Machines
dc.contributor.author | Gao, Feng | en_US |
dc.contributor.author | Hayes, John P. (John Patrick) | en_US |
dc.date.accessioned | 2006-09-08T20:58:13Z | |
dc.date.available | 2006-09-08T20:58:13Z | |
dc.date.issued | 2003-10 | en_US |
dc.identifier.citation | Gao, Feng; Hayes, John P.; (2003). "On-Line Monitor Design of Finite-State Machines." Journal of Electronic Testing 19(5): 537-548. <http://hdl.handle.net/2027.42/43011> | en_US |
dc.identifier.issn | 0923-8174 | en_US |
dc.identifier.issn | 1573-0727 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/43011 | |
dc.description.abstract | On-line monitoring is a useful technique for ensuring system reliability. By continuously supervising the system's operation, a wide range of problems, such as physical defects, transient faults and design errors, can be detected. A monitor M *'s behavior can be viewed as an abstraction of the target system M 's behavior, and can be represented by a homomorphic mapping from M to M *. We present a systematic procedure to select homomorphisms for monitor design and measure their costs based on a behavioral fault model. Analysis of the method shows that monitors with very few states and low area can provide high fault coverage. Experimental results are presented which quantify the basic trade-off between area overhead and fault coverage. Simulation results under the industry-standard single stuck-at fault model are also reported. | en_US |
dc.format.extent | 182221 bytes | |
dc.format.extent | 3115 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.language.iso | en_US | |
dc.publisher | Kluwer Academic Publishers; Springer Science+Business Media | en_US |
dc.subject.other | Engineering | en_US |
dc.subject.other | Computer-Aided Engineering (CAD, CAE) and Design | en_US |
dc.subject.other | Electronic and Computer Engineering | en_US |
dc.subject.other | Circuits and Systems | en_US |
dc.subject.other | On-line Monitoring | en_US |
dc.subject.other | Homomorphism | en_US |
dc.subject.other | Finite-state Machine | en_US |
dc.title | On-Line Monitor Design of Finite-State Machines | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Electrical Engineering | en_US |
dc.subject.hlbtoplevel | Engineering | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Advanced Computer Architecture Lab., University of Michigan, Ann Arbor, MI, 48109, USA | en_US |
dc.contributor.affiliationum | Advanced Computer Architecture Lab., University of Michigan, Ann Arbor, MI, 48109, USA | en_US |
dc.contributor.affiliationumcampus | Ann Arbor | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/43011/1/10836_2004_Article_5142580.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1023/A:1025173913889 | en_US |
dc.identifier.source | Journal of Electronic Testing | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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