The Coupling Model for Function and Delay Faults

Abstract

We propose a high-level fault model, the coupling fault (CF) model, that aims to cover both functional and timing faults in an integrated way. The basic properties of CFs and the corresponding tests are analyzed, focusing on their relationship with other fault models and their test requirements. A test generation program COTEGE for CFs is presented. Experiments with COTEGE are described which show that (reduced) coupling test sets can efficiently cover standard stuck-at-0/1 faults in a variety of different realizations. The corresponding coupling delay tests detect all robust path delay faults in any realization of a logic function.