Ultrafast-ultrafine probing of high-speed electrical waveforms using a scanning force microscope with photoconductive gating
dc.contributor.author | Wakana, Shin-ichi | en_US |
dc.contributor.author | Hama, S. | en_US |
dc.contributor.author | Nees, John A. | en_US |
dc.date.accessioned | 2006-09-08T21:19:50Z | |
dc.date.available | 2006-09-08T21:19:50Z | |
dc.date.issued | 1996-07 | en_US |
dc.identifier.citation | Nees, J.; Wakana, S. I.; Hama, S.; (1996). "Ultrafast-ultrafine probing of high-speed electrical waveforms using a scanning force microscope with photoconductive gating." Optical and Quantum Electronics 28(7): 843-865. <http://hdl.handle.net/2027.42/43337> | en_US |
dc.identifier.issn | 1572-817X | en_US |
dc.identifier.issn | 0306-8919 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/43337 | |
dc.description.abstract | Picosecond photoconductivity in low-temperature-grown GaAs (LT GaAs) has been used to provide temporal resolution both in rigid probes and in scanning force microscope probes. This article reviews the fabrication and use of such probes. 2.5 ps temporal resolution and few microvolts sensitivity are obtained at arbitrary points on circuits with a spatial definition of 100 nm. Rigid probes are tested in application to analogue and digital circuits. As an alternative to electron beam testing, scanning force probes are applied to in situ imaging and waveform measurement. Finally, the use of time-resolved waveform analysis with scanning-force microscopy probes with semiconductor laser sources is demonstrated. | en_US |
dc.format.extent | 2181581 bytes | |
dc.format.extent | 3115 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.language.iso | en_US | |
dc.publisher | Kluwer Academic Publishers; Chapman & Hall ; Springer Science+Business Media | en_US |
dc.subject.other | Applied Optics, Optoelectronics, Optical Devices | en_US |
dc.subject.other | Physics | en_US |
dc.subject.other | Characterization and Evaluation Materials | en_US |
dc.subject.other | Computer Communication Networks | en_US |
dc.subject.other | Electronic and Computer Engineering | en_US |
dc.title | Ultrafast-ultrafine probing of high-speed electrical waveforms using a scanning force microscope with photoconductive gating | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Mechanical Engineering | en_US |
dc.subject.hlbsecondlevel | Electrictrical Engineering | en_US |
dc.subject.hlbtoplevel | Engineering | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Center for Ultrafast Optical Science, University of Michigan, 1006 IST Bldg., 2200 Bonisteel, 48 109-2099, Ann Arbor, MI, USA | en_US |
dc.contributor.affiliationother | Fujitsu Laboratories Ltd, 1-10 Morinosato, Wakamiya Atsugi, 243-01, Kanagawa, Japan | en_US |
dc.contributor.affiliationother | Fujitsu Laboratories Ltd, 1-10 Morinosato, Wakamiya Atsugi, 243-01, Kanagawa, Japan | en_US |
dc.contributor.affiliationumcampus | Ann Arbor | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/43337/1/11082_2004_Article_BF00820152.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1007/BF00820152 | en_US |
dc.identifier.source | Optical and Quantum Electronics | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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