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Resonant-tunneling devices for millimeter-wave generation

dc.contributor.authorMains, R. K.en_US
dc.contributor.authorMehdi, Imranen_US
dc.contributor.authorHaddad, George I.en_US
dc.date.accessioned2006-09-11T14:57:14Z
dc.date.available2006-09-11T14:57:14Z
dc.date.issued1989-06en_US
dc.identifier.citationMains, R. K.; Mehdi, I.; Haddad, G. I.; (1989). "Resonant-tunneling devices for millimeter-wave generation." International Journal of Infrared and Millimeter Waves 10(6): 595-620. <http://hdl.handle.net/2027.42/44541>en_US
dc.identifier.issn1572-9559en_US
dc.identifier.issn0195-9271en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/44541
dc.description.abstractOscillations from resonant-tunneling diodes have been observed up to 200 GHz, and theoretical estimates predict that device performance should extend into the THz range. This paper addresses the issue of the ultimate frequency response and power generation capability of these devices. Techniques recently developed to solve the time-dependent Schrödinger equation are used to predict the rf power vs. frequency obtainable from resonant-tunneling diode oscillators, based on the calculated small-signal response. Factors limiting the rf power output from these devices are presented. Also, recently obtained dc experimental results for the In .53 Ga .47 As-In x Al 1-x As heterostructure material system grown on InP are presented. Using a quasi-static approximation, the rf power available from these devices under large-signal conditions is estimated.en_US
dc.format.extent929513 bytes
dc.format.extent3115 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherKluwer Academic Publishers-Plenum Publishers; Plenum Publishing Corporation ; Springer Science+Business Mediaen_US
dc.subject.otherElectronic and Computer Engineeringen_US
dc.subject.otherPhysicsen_US
dc.subject.otherMeteorology/Climatologyen_US
dc.subject.otherAstronomyen_US
dc.titleResonant-tunneling devices for millimeter-wave generationen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelMathematicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCenter for High-Frequency Microelectronics Department of Electrical Engineering and Computer Science, The University of Michigan, 48109, Ann Arbor, Michiganen_US
dc.contributor.affiliationumCenter for High-Frequency Microelectronics Department of Electrical Engineering and Computer Science, The University of Michigan, 48109, Ann Arbor, Michiganen_US
dc.contributor.affiliationumCenter for High-Frequency Microelectronics Department of Electrical Engineering and Computer Science, The University of Michigan, 48109, Ann Arbor, Michiganen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/44541/1/10762_2005_Article_BF01009563.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1007/BF01009563en_US
dc.identifier.sourceInternational Journal of Infrared and Millimeter Wavesen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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