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Scattering from loaded grooves

dc.contributor.authorBarkeshli, Kasraen_US
dc.date.accessioned2006-09-11T14:57:52Z
dc.date.available2006-09-11T14:57:52Z
dc.date.issued1992-02en_US
dc.identifier.citationBarkeshli, Kasra; (1992). "Scattering from loaded grooves." International Journal of Infrared and Millimeter Waves 13(2): 171-196. <http://hdl.handle.net/2027.42/44549>en_US
dc.identifier.issn0195-9271en_US
dc.identifier.issn1572-9559en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/44549
dc.description.abstractElectromagnetic scattering from a two-dimensional groove recessed in an arbitrarily thick conducting screen is studied. The groove may be empty or loaded with a lossy material which may or may not completely fill the cavity. For the partially loaded groove, the filling material is assumed electrically dense so that the standard impedance boundary condition is applicable at the top surface of the material. Employing a full-wave analysis, integral equations are derived for the tangential components of the electric field over the aperture. It is shown that the equations are identical for both partially loaded and completely loaded (or empty) cases provided that the aperture admittance of the groove is treated as the equivalent admittance of the internal medium looking into the aperture, thus simplifying the integral equations.en_US
dc.format.extent895066 bytes
dc.format.extent3115 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherKluwer Academic Publishers-Plenum Publishers; Plenum Publishing Corporation ; Springer Science+Business Mediaen_US
dc.subject.otherElectromagnetic Scattering and Detectionen_US
dc.subject.otherAstronomyen_US
dc.subject.otherPhysicsen_US
dc.subject.otherMeteorology/Climatologyen_US
dc.subject.otherElectronic and Computer Engineeringen_US
dc.subject.otherFull-wave Analysisen_US
dc.subject.otherImpedance Boundary Conditionen_US
dc.subject.otherCracks and Groovesen_US
dc.titleScattering from loaded groovesen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelMathematicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Electrical Enginnering and Computer Science, The University of Michigan, 48109-2122, Ann Arbor, Michiganen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/44549/1/10762_2005_Article_BF01010652.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1007/BF01010652en_US
dc.identifier.sourceInternational Journal of Infrared and Millimeter Wavesen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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