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Efficient registration for precision inspection of free-form surfaces

dc.contributor.authorSrivatsan, Vijayen_US
dc.contributor.authorBarhak, Jacoben_US
dc.contributor.authorZhu, Liangen_US
dc.contributor.authorKatz, Reuvenen_US
dc.date.accessioned2006-09-11T16:32:34Z
dc.date.available2006-09-11T16:32:34Z
dc.date.issued2006-03-18en_US
dc.identifier.citationZhu, Liang; Barhak, Jacob; Srivatsan, Vijay; Katz, Reuven; (2006). "Efficient registration for precision inspection of free-form surfaces." The International Journal of Advanced Manufacturing Technology (): 1-11. <http://hdl.handle.net/2027.42/45849>en_US
dc.identifier.issn0268-3768en_US
dc.identifier.issn1433-3015en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/45849
dc.identifier.urihttp://www.ncbi.nlm.nih.gov/sites/entrez?cmd=retrieve&db=pubmed&list_uids=7021141&dopt=citationen_US
dc.description.abstractPrecision inspection of free-form surface is difficult with current industry practices that rely on accurate fixtures. Alternatively, the measurements can be aligned to the part model using a geometry-based registration method, such as the iterative closest point (ICP) method, to achieve a fast and automatic inspection process. This paper discusses various techniques that accelerate the registration process and improve the efficiency of the ICP method. First, the data structures of approximated nearest nodes and topological neighbor facets are combined to speed up the closest point calculation. The closest point calculation is further improved with the cached facets across iteration steps. The registration efficiency can also be enhanced by incorporating signal-to-noise ratio into the transformation of correspondence sets to reduce or remove the noise of outliers. Last, an acceleration method based on linear or quadratic extrapolation is fine-tuned to provide the fast yet robust iteration process. These techniques have been implemented on a four-axis blade inspection machine where no accurate fixture is required. The tests of measurement simulations and inspection case studies indicated that the presented registration method is accurate and efficient.en_US
dc.format.extent420672 bytes
dc.format.extent3115 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherSpringer Verlag; Springer-Verlag London Limiteden_US
dc.subject.otherOptical Inspectionen_US
dc.subject.otherSimulated Measurementen_US
dc.subject.otherICP Algorithmen_US
dc.subject.otherRegistration Between Point Set and CAD Modelen_US
dc.subject.otherApproximated Nearest Nodeen_US
dc.titleEfficient registration for precision inspection of free-form surfacesen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelManagementen_US
dc.subject.hlbsecondlevelInformation and Library Scienceen_US
dc.subject.hlbsecondlevelIndustrial and Operations Engineeringen_US
dc.subject.hlbsecondlevelComputer Scienceen_US
dc.subject.hlbsecondlevelEconomicsen_US
dc.subject.hlbtoplevelBusinessen_US
dc.subject.hlbtoplevelSocial Sciencesen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumNSF Engineering Research Center for Reconfigurable Manufacturing Systems, College Of Engineering, University Of Michigan, 2250 G.G. Brown Building, 2350 Hayward Street, Ann Arbor, MI, 48109-2125, USA,en_US
dc.contributor.affiliationumNSF Engineering Research Center for Reconfigurable Manufacturing Systems, College Of Engineering, University Of Michigan, 2250 G.G. Brown Building, 2350 Hayward Street, Ann Arbor, MI, 48109-2125, USA,en_US
dc.contributor.affiliationumNSF Engineering Research Center for Reconfigurable Manufacturing Systems, College Of Engineering, University Of Michigan, 2250 G.G. Brown Building, 2350 Hayward Street, Ann Arbor, MI, 48109-2125, USA,en_US
dc.contributor.affiliationumNSF Engineering Research Center for Reconfigurable Manufacturing Systems, College Of Engineering, University Of Michigan, 2250 G.G. Brown Building, 2350 Hayward Street, Ann Arbor, MI, 48109-2125, USA,en_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.identifier.pmid7021141en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/45849/1/170_2005_Article_370.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1007/s00170-005-0370-9en_US
dc.identifier.sourceThe International Journal of Advanced Manufacturing Technologyen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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