Show simple item record

Lean buffering in serial production lines with non-exponential machines

dc.contributor.authorMeerkov, Semyon M.en_US
dc.contributor.authorEnginarlar, Emreen_US
dc.contributor.authorLi, Jingshanen_US
dc.date.accessioned2006-09-11T18:25:12Z
dc.date.available2006-09-11T18:25:12Z
dc.date.issued2005-06en_US
dc.identifier.citationEnginarlar, Emre; Li, Jingshan; Meerkov, Semyon M.; (2005). "Lean buffering in serial production lines with non-exponential machines." OR Spectrum 27 (2-3): 195-219. <http://hdl.handle.net/2027.42/46954>en_US
dc.identifier.issn0171-6468en_US
dc.identifier.issn1436-6304en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/46954
dc.description.abstractIn this paper, lean buffering (i.e., the smallest level of buffering necessary and sufficient to ensure the desired production rate of a manufacturing system) is analyzed for the case of serial lines with machines having Weibull, gamma, and log-normal distributions of up- and downtime. The results obtained show that: (1) the lean level of buffering is not very sensitive to the type of up- and downtime distributions and depends mainly on their coefficients of variation, CV up and CV down ; (2) the lean level of buffering is more sensitive to CV down than to CV up but the difference in sensitivities is not too large (typically, within 20%). Based on these observations, an empirical law for calculating the lean level of buffering as a function of machine efficiency, line efficiency, the number of machines in the system, and CV up and CV down is introduced. It leads to a reduction of lean buffering by a factor of up to 4, as compared with that calculated using the exponential assumption. It is conjectured that this empirical law holds for any unimodal distribution of up- and downtime, provided that CV up and CV down are less than 1.en_US
dc.format.extent4091557 bytes
dc.format.extent3115 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherSpringer-Verlagen_US
dc.subject.otherSerial Linesen_US
dc.subject.otherOptimizationen_US
dc.subject.otherCoefficients of Variationen_US
dc.subject.otherOperation Research/Decision Theoryen_US
dc.subject.otherEconomics / Management Scienceen_US
dc.subject.otherNon-exponential Machine Reliability Modelen_US
dc.subject.otherCalculus of Variations and Optimal Controlen_US
dc.subject.otherBusiness/Management Science, Generalen_US
dc.subject.otherLean Production Systemsen_US
dc.subject.otherEmpirical Lawen_US
dc.titleLean buffering in serial production lines with non-exponential machinesen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelIndustrial and Operations Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science, University of Michigan, MI 48109-2122, Ann Arbor, USA,en_US
dc.contributor.affiliationotherDecision Applications Division, Los Alamos National Laboratory, NM 87545, Los Alamos, USA,en_US
dc.contributor.affiliationotherManufacturing Systems Research Laboratory, GM Research and Development Center, MI 48090-9055, Warren, USA,en_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/46954/1/291_2004_Article_187.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1007/s00291-004-0187-1en_US
dc.identifier.sourceOR Spectrumen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.