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Analysis of optical propagation in thick holographic gratings

dc.contributor.authorAlferness, R.en_US
dc.date.accessioned2006-09-11T18:31:03Z
dc.date.available2006-09-11T18:31:03Z
dc.date.issued1975-05en_US
dc.identifier.citationAlferness, R.; (1975). "Analysis of optical propagation in thick holographic gratings." Applied Physics 7(1): 29-33. <http://hdl.handle.net/2027.42/47036>en_US
dc.identifier.issn0340-3793en_US
dc.identifier.issn1432-0630en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/47036
dc.description.abstractA method of analyzing optical propagation in thick holographic gratings by decomposition of the thick material into thin gratings is discussed. The method is readily applicable to study propagation in multiple gratings of arbitrary spatial frequency and orientation recorded in the same thick emulsion. Applied to the double grating case, the method predicts strong cross-coupling between the two gratings for proper relative slope of the gratings. Results are given.en_US
dc.format.extent397310 bytes
dc.format.extent3115 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherSpringer-Verlagen_US
dc.subject.otherCondensed Matteren_US
dc.subject.otherPhysicsen_US
dc.subject.otherThick Holographic Gratingsen_US
dc.subject.otherOptical and Electronic Materialsen_US
dc.subject.otherOptical Propagationen_US
dc.subject.otherCharacterization and Evaluation Materialsen_US
dc.subject.otherOperating Procedures, Materials Treatmenten_US
dc.subject.otherSurfaces and Interfaces, Thin Filmsen_US
dc.subject.otherNanotechnologyen_US
dc.titleAnalysis of optical propagation in thick holographic gratingsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelMathematicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumElectro-Optics Lab, Dept. of ECE, University of Michigan, 48104, Ann Arbor, Mich., USAen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/47036/1/339_2004_Article_BF00900516.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1007/BF00900516en_US
dc.identifier.sourceApplied Physicsen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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