Analysis of optical propagation in thick holographic gratings
dc.contributor.author | Alferness, R. | en_US |
dc.date.accessioned | 2006-09-11T18:31:03Z | |
dc.date.available | 2006-09-11T18:31:03Z | |
dc.date.issued | 1975-05 | en_US |
dc.identifier.citation | Alferness, R.; (1975). "Analysis of optical propagation in thick holographic gratings." Applied Physics 7(1): 29-33. <http://hdl.handle.net/2027.42/47036> | en_US |
dc.identifier.issn | 0340-3793 | en_US |
dc.identifier.issn | 1432-0630 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/47036 | |
dc.description.abstract | A method of analyzing optical propagation in thick holographic gratings by decomposition of the thick material into thin gratings is discussed. The method is readily applicable to study propagation in multiple gratings of arbitrary spatial frequency and orientation recorded in the same thick emulsion. Applied to the double grating case, the method predicts strong cross-coupling between the two gratings for proper relative slope of the gratings. Results are given. | en_US |
dc.format.extent | 397310 bytes | |
dc.format.extent | 3115 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.language.iso | en_US | |
dc.publisher | Springer-Verlag | en_US |
dc.subject.other | Condensed Matter | en_US |
dc.subject.other | Physics | en_US |
dc.subject.other | Thick Holographic Gratings | en_US |
dc.subject.other | Optical and Electronic Materials | en_US |
dc.subject.other | Optical Propagation | en_US |
dc.subject.other | Characterization and Evaluation Materials | en_US |
dc.subject.other | Operating Procedures, Materials Treatment | en_US |
dc.subject.other | Surfaces and Interfaces, Thin Films | en_US |
dc.subject.other | Nanotechnology | en_US |
dc.title | Analysis of optical propagation in thick holographic gratings | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbsecondlevel | Mathematics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Electro-Optics Lab, Dept. of ECE, University of Michigan, 48104, Ann Arbor, Mich., USA | en_US |
dc.contributor.affiliationumcampus | Ann Arbor | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/47036/1/339_2004_Article_BF00900516.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1007/BF00900516 | en_US |
dc.identifier.source | Applied Physics | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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