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Hard X-ray generation from solids driven by relativistic intensity in the lambda-cubed regime
dc.contributor.authorMordovanakis, Aghapi G.en_US
dc.contributor.authorWilcox, M.en_US
dc.contributor.authorMourou, Gerard A.en_US
dc.contributor.authorChamberlain, C. C.en_US
dc.contributor.authorKrol, Andrzejen_US
dc.contributor.authorHou, Bixueen_US
dc.contributor.authorNees, John A.en_US
dc.contributor.authorKieffer, Jean-Claudeen_US
dc.contributor.authorChen, L. M.en_US
dc.date.accessioned2006-09-11T18:32:18Z
dc.date.available2006-09-11T18:32:18Z
dc.date.issued2006-04en_US
dc.identifier.citationHou, B.; Nees, J.; Mordovanakis, A.; Wilcox, M.; Mourou, G.; Chen, L.M.; Kieffer, J.-C.; Chamberlain, C.C.; Krol, A.; (2006). "Hard X-ray generation from solids driven by relativistic intensity in the lambda-cubed regime." Applied Physics B 83(1): 81-85. <http://hdl.handle.net/2027.42/47054>en_US
dc.identifier.issn1432-0649en_US
dc.identifier.issn0946-2171en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/47054
dc.description.abstractInteraction of relativistic intensity laser pulses encompassed at focus by a volume of a few wavelengths cubed with solids is examined. Spectroscopy of hard X-rays of several metallic targets, including Cu, Ge, Mo, Ag, and Sn, irradiated in this regime at a high repetition rate (0.4 kHz), has been experimentally studied. The K α and K β peaks of all targets were obtained. Averaged electron temperatures of several tens of keV and total X-ray conversion efficiencies up to 0.02% are calculated. The X-ray source size is measured to be ∼10 micron with varying elliptical shape.en_US
dc.format.extent812376 bytes
dc.format.extent3115 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherSpringer-Verlagen_US
dc.titleHard X-ray generation from solids driven by relativistic intensity in the lambda-cubed regimeen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelMathematicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumFocus Center and Center for Ultrafast Optical Science, University of Michigan, 2200 Bonisteel Boulevard, Ann Arbor, MI, 48109-2099, USA,en_US
dc.contributor.affiliationumFocus Center and Center for Ultrafast Optical Science, University of Michigan, 2200 Bonisteel Boulevard, Ann Arbor, MI, 48109-2099, USA,en_US
dc.contributor.affiliationumFocus Center and Center for Ultrafast Optical Science, University of Michigan, 2200 Bonisteel Boulevard, Ann Arbor, MI, 48109-2099, USA,en_US
dc.contributor.affiliationumFocus Center and Center for Ultrafast Optical Science, University of Michigan, 2200 Bonisteel Boulevard, Ann Arbor, MI, 48109-2099, USA,en_US
dc.contributor.affiliationumFocus Center and Center for Ultrafast Optical Science, University of Michigan, 2200 Bonisteel Boulevard, Ann Arbor, MI, 48109-2099, USA,en_US
dc.contributor.affiliationotherDepartment of Radiology, SUNY Upstate Medical University, 750 E. Adams. St., Syracuse, NY, 13210, USA,en_US
dc.contributor.affiliationotherINRS-énergie et Matériaux, Université du Québec, Varennes, Québec, 1650 Montée Sainte-Julie, J3X 1S2, Canada,en_US
dc.contributor.affiliationotherDepartment of Radiology, SUNY Upstate Medical University, 750 E. Adams. St., Syracuse, NY, 13210, USA,en_US
dc.contributor.affiliationotherINRS-énergie et Matériaux, Université du Québec, Varennes, Québec, 1650 Montée Sainte-Julie, J3X 1S2, Canada,en_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/47054/1/340_2005_Article_2085.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1007/s00340-005-2085-xen_US
dc.identifier.sourceApplied Physics Ben_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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