Optimal algorithms for symmetry detection in two and three dimensions
dc.contributor.author | Wolter, Jan Dithmar | en_US |
dc.contributor.author | Volz, Richard A. | en_US |
dc.contributor.author | Woo, Tony C. | en_US |
dc.date.accessioned | 2006-09-11T18:37:52Z | |
dc.date.available | 2006-09-11T18:37:52Z | |
dc.date.issued | 1985-07 | en_US |
dc.identifier.citation | Wolter, Jan D.; Woo, Tony C.; Volz, Richard A.; (1985). "Optimal algorithms for symmetry detection in two and three dimensions." The Visual Computer 1(1): 37-48. <http://hdl.handle.net/2027.42/47135> | en_US |
dc.identifier.issn | 0178-2789 | en_US |
dc.identifier.issn | 1432-8726 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/47135 | |
dc.description.abstract | Exact algorithms for detecting all rotational and involutional symmetries in point sets, polygons and polyhedra are described. The time complexities of the algorithms are shown to be θ ( n ) for polygons and θ ( n log n ) for two- and three-dimensional point sets. θ ( n log n ) time is also required for general polyhedra, but for polyhedra with connected, planar surface graphs θ ( n ) time can be achieved. All algorithms are optimal in time complexity, within constants. | en_US |
dc.format.extent | 1066358 bytes | |
dc.format.extent | 3115 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.language.iso | en_US | |
dc.publisher | Springer-Verlag | en_US |
dc.subject.other | Computer Science, General | en_US |
dc.subject.other | Computer Science | en_US |
dc.subject.other | Graph Isomorphism | en_US |
dc.subject.other | Computer Graphics | en_US |
dc.subject.other | Pattern Matching | en_US |
dc.subject.other | Computational Geometry | en_US |
dc.subject.other | Similarity | en_US |
dc.subject.other | Image Processing | en_US |
dc.subject.other | Symmetry | en_US |
dc.subject.other | Artificial Intelligence (Incl. Robotics) | en_US |
dc.title | Optimal algorithms for symmetry detection in two and three dimensions | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Engineering (General) | en_US |
dc.subject.hlbsecondlevel | Computer Science | en_US |
dc.subject.hlbtoplevel | Engineering | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Industrial and Operations Engineering, The University of Michigan, 48109, Ann Arbor, MI, USA | en_US |
dc.contributor.affiliationum | Department of Electrical Engineering and Computer Science, The University of Michigan, 48109, Ann Arbor, MI, USA | en_US |
dc.contributor.affiliationum | Department of Electrical Engineering and Computer Science, The University of Michigan, 48109, Ann Arbor, MI, USA | en_US |
dc.contributor.affiliationumcampus | Ann Arbor | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/47135/1/371_2005_Article_BF01901268.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1007/BF01901268 | en_US |
dc.identifier.source | The Visual Computer | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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