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Optimal algorithms for symmetry detection in two and three dimensions

dc.contributor.authorWolter, Jan Dithmaren_US
dc.contributor.authorVolz, Richard A.en_US
dc.contributor.authorWoo, Tony C.en_US
dc.date.accessioned2006-09-11T18:37:52Z
dc.date.available2006-09-11T18:37:52Z
dc.date.issued1985-07en_US
dc.identifier.citationWolter, Jan D.; Woo, Tony C.; Volz, Richard A.; (1985). "Optimal algorithms for symmetry detection in two and three dimensions." The Visual Computer 1(1): 37-48. <http://hdl.handle.net/2027.42/47135>en_US
dc.identifier.issn0178-2789en_US
dc.identifier.issn1432-8726en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/47135
dc.description.abstractExact algorithms for detecting all rotational and involutional symmetries in point sets, polygons and polyhedra are described. The time complexities of the algorithms are shown to be θ ( n ) for polygons and θ ( n log n ) for two- and three-dimensional point sets. θ ( n log n ) time is also required for general polyhedra, but for polyhedra with connected, planar surface graphs θ ( n ) time can be achieved. All algorithms are optimal in time complexity, within constants.en_US
dc.format.extent1066358 bytes
dc.format.extent3115 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherSpringer-Verlagen_US
dc.subject.otherComputer Science, Generalen_US
dc.subject.otherComputer Scienceen_US
dc.subject.otherGraph Isomorphismen_US
dc.subject.otherComputer Graphicsen_US
dc.subject.otherPattern Matchingen_US
dc.subject.otherComputational Geometryen_US
dc.subject.otherSimilarityen_US
dc.subject.otherImage Processingen_US
dc.subject.otherSymmetryen_US
dc.subject.otherArtificial Intelligence (Incl. Robotics)en_US
dc.titleOptimal algorithms for symmetry detection in two and three dimensionsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelEngineering (General)en_US
dc.subject.hlbsecondlevelComputer Scienceen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Industrial and Operations Engineering, The University of Michigan, 48109, Ann Arbor, MI, USAen_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science, The University of Michigan, 48109, Ann Arbor, MI, USAen_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science, The University of Michigan, 48109, Ann Arbor, MI, USAen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/47135/1/371_2005_Article_BF01901268.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1007/BF01901268en_US
dc.identifier.sourceThe Visual Computeren_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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