REVIEW ARTICLE: Electron-drag effects in coupled electron systems

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dc.contributor.author Rojo, Alberto G. en_US
dc.date.accessioned 2006-12-19T18:56:11Z
dc.date.available 2006-12-19T18:56:11Z
dc.date.issued 1999-02-08 en_US
dc.identifier.citation Rojo, A G (1999). "REVIEW ARTICLE: Electron-drag effects in coupled electron systems ." Journal of Physics: Condensed Matter. 11(5): R31-R52. <http://hdl.handle.net/2027.42/48880> en_US
dc.identifier.issn 0953-8984 en_US
dc.identifier.uri http://hdl.handle.net/2027.42/48880
dc.description.abstract The advances in the techniques used for fabrication and lithography of semiconductors have made it possible to study bi-layer systems made of two electronic layers separated by distances of several hundred ångströms. In this situation the electrons in layer 1 are distinguishable from those in layer 2, and can communicate through the direct inter-layer Coulomb interaction. In particular, if a current is applied to one of the layers, the electrons in the second will be dragged, giving rise to a transresistance ρD. In this article we review recent theoretical and experimental developments in the understanding of this effect. At very low temperatures it turns out that phonons dominate the transresistance. The direct Coulomb interaction and plasmon excitations are important at temperatures T >0.1TF, with TF the Fermi temperature. If a magnetic field is applied, the transresistance is increased, in a very interesting interplay between ρD and Landau quantization. The non-dissipative drag is also reviewed. en_US
dc.format.extent 3118 bytes
dc.format.extent 281292 bytes
dc.format.mimetype text/plain
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.publisher IOP Publishing Ltd en_US
dc.title REVIEW ARTICLE: Electron-drag effects in coupled electron systems en_US
dc.type Article en_US
dc.subject.hlbsecondlevel Physics en_US
dc.subject.hlbtoplevel Science en_US
dc.description.peerreviewed Peer Reviewed en_US
dc.contributor.affiliationum Department of Physics, The University of Michigan, Ann Arbor, MI 48109-1120, USA en_US
dc.contributor.affiliationumcampus Ann Arbor en_US
dc.description.bitstreamurl http://deepblue.lib.umich.edu/bitstream/2027.42/48880/2/c905r1.pdf en_US
dc.identifier.doi http://dx.doi.org/10.1088/0953-8984/11/5/004 en_US
dc.identifier.source Journal of Physics: Condensed Matter. en_US
dc.owningcollname Interdisciplinary and Peer-Reviewed
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