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dc.contributor.authorYacoby, Y.en_US
dc.contributor.authorPindak, R.en_US
dc.contributor.authorMacHarrie, R.en_US
dc.contributor.authorPfeiffer, L.en_US
dc.contributor.authorBerman, L.en_US
dc.contributor.authorClarke, Royen_US
dc.date.accessioned2006-12-19T18:56:26Z
dc.date.available2006-12-19T18:56:26Z
dc.date.issued2000-05-01en_US
dc.identifier.citationYacoby, Y; Pindak, R; MacHarrie, R ; Pfeiffer, L; Berman, L; Clarke, R (2000). "Direct structure determination of systems with two-dimensional periodicity." Journal of Physics: Condensed Matter. 12(17): 3929-3938. <http://hdl.handle.net/2027.42/48883>en_US
dc.identifier.issn0953-8984en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/48883
dc.description.abstractWe describe a new x-ray method for the direct measurement of structures which have two-dimensional (2D) periodicity, and are positionally correlated with an underlying substrate crystal. Examples include reconstructed crystal structures at interfaces, layered heterostructures, crystalline-amorphous interfaces, and self-assembled structures on crystalline substrates. The structure is obtained by determining the complex scattering factors along the Bragg rods and Fourier back-transforming them into real space. The method for determining the complex scattering factors has two variations. The first is generally applicable. It involves the measurement of the derivative of the diffraction phase along the Bragg rods and the subsequent determination of the diffraction phase using the known structure of the substrate. The second is applicable to 2D systems, with an unknown structure, that are buried within a crystal with a known structure. In this case the diffraction phase is determined without the need to measure its derivative first. We experimentally demonstrate both variations by determining the diffraction phase along one Bragg rod of a GaAs sample with four buried AlAs monolayers. Using simulated data along the Bragg rods within a volume in reciprocal space, we show that the method yields the three-dimensional structure of 2D systems with atomic resolution.en_US
dc.format.extent3118 bytes
dc.format.extent220175 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherIOP Publishing Ltden_US
dc.titleDirect structure determination of systems with two-dimensional periodicityen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationotherRacah Institute of Physics, Hebrew University, Jerusalem, 91904, Israelen_US
dc.contributor.affiliationotherBell Laboratories, Lucent Technologies, 700 Mountain Ave, Murray Hill, NJ 07974, USAen_US
dc.contributor.affiliationotherBell Laboratories, Lucent Technologies, 700 Mountain Ave, Murray Hill, NJ 07974, USAen_US
dc.contributor.affiliationotherBell Laboratories, Lucent Technologies, 700 Mountain Ave, Murray Hill, NJ 07974, USAen_US
dc.contributor.affiliationotherNational Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY, USAen_US
dc.contributor.affiliationotherRandall Laboratory of Physics, University of Michigan, Ann Arbor, MI 48109-1120, USAen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/48883/2/c01701.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1088/0953-8984/12/17/301en_US
dc.identifier.sourceJournal of Physics: Condensed Matter.en_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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