Structural and electrical properties of c-axis epitaxial and polycrystalline Sr3Bi4Ti6O21 thin films
dc.contributor.author | Zhang, S. T. | en_US |
dc.contributor.author | Chen, Y. F. | en_US |
dc.contributor.author | Sun, H. P. | en_US |
dc.contributor.author | Pan, Xiaoqing | en_US |
dc.contributor.author | Tan, W. S. | en_US |
dc.contributor.author | Liu, Zhi-Guo | en_US |
dc.contributor.author | Ming, N. B. | en_US |
dc.date.accessioned | 2006-12-19T18:57:05Z | |
dc.date.available | 2006-12-19T18:57:05Z | |
dc.date.issued | 2003-03-05 | en_US |
dc.identifier.citation | Zhang, S T; Chen, Y F; Sun, H P; Pan, X Q; Tan, W S; Liu, Z G; Ming, N B (2003). "Structural and electrical properties of c-axis epitaxial and polycrystalline Sr3Bi4Ti6O21 thin films." Journal of Physics: Condensed Matter. 15(8): 1223-1233. <http://hdl.handle.net/2027.42/48891> | en_US |
dc.identifier.issn | 0953-8984 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/48891 | |
dc.description.abstract | c-axis epitaxial and polycrystalline Sr3Bi4Ti6O21 (SBTi) thin films were fabricated on (001)SrTiO3 (STO) single-crystal substrates and Pt/Ti2/SiO2/Si substrates respectively, by pulsed laser deposition (PLD). Structures of the films were systematically characterized by x-ray diffraction (XRD), including θ– 2θ-scans, rocking curve scans and φ-scans, atomic force microscopy and transmission electron microscopy (TEM). The epitaxial orientation relation of the SBTi films on STO is established by selected-area electron diffraction and XRD φ-scans to be (001)SBTi ∥ (001)STO, [1 _1 0]SBTi ∥ [010]STO. Cross-sectional high-resolution TEM studies on the epitaxial SBTi film revealed that SBTi is a single-phase material. A special kind of irrational atomic shift along the [001] direction was observed and is discussed in detail. By using an evanescent microwave probe (EMP), the room-temperature dielectric constant of the epitaxial SBTi film was measured to be 211 ± 20. Excellent electrical properties of the polycrystalline SBTi films with Pt bottom and top electrodes were exhibited: the Pr and Ec values were 4.1 μC cm−2 and 75 kV cm−1 respectively, the nonvolatile polarizations decreased by less than 5% after 2.22 × 109 switching cycles and the dielectric constant and loss tangent were 363 and 0.04 at 100 kHz. | en_US |
dc.format.extent | 3118 bytes | |
dc.format.extent | 296531 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.publisher | IOP Publishing Ltd | en_US |
dc.title | Structural and electrical properties of c-axis epitaxial and polycrystalline Sr3Bi4Ti6O21 thin films | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Materials Science and Engineering, The University of Michigan, Ann Arbor, MI 48109-2136, USA | en_US |
dc.contributor.affiliationum | Department of Materials Science and Engineering, The University of Michigan, Ann Arbor, MI 48109-2136, USA | en_US |
dc.contributor.affiliationother | National Laboratory of Solid State Microstructures and Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, China | en_US |
dc.contributor.affiliationother | National Laboratory of Solid State Microstructures and Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, China | en_US |
dc.contributor.affiliationother | National Laboratory of Solid State Microstructures and Department of Physics, Nanjing University, Nanjing 210093, China | en_US |
dc.contributor.affiliationother | National Laboratory of Solid State Microstructures and Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, China | en_US |
dc.contributor.affiliationother | National Laboratory of Solid State Microstructures and Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, China | en_US |
dc.contributor.affiliationumcampus | Ann Arbor | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/48891/2/c30807.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1088/0953-8984/15/8/307 | en_US |
dc.identifier.source | Journal of Physics: Condensed Matter. | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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