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Fabrication and characterization of wire-like SnO2

dc.contributor.authorLiu, C. M.en_US
dc.contributor.authorZu, X. T.en_US
dc.contributor.authorWei, Q. M.en_US
dc.contributor.authorWang, L. M.en_US
dc.date.accessioned2006-12-19T18:58:43Z
dc.date.available2006-12-19T18:58:43Z
dc.date.issued2006-06-21en_US
dc.identifier.citationLiu, C M; Zu, X T; Wei, Q M; Wang, L M (2006). "Fabrication and characterization of wire-like SnO2." Journal of Physics D: Applied Physics. 39(12): 2494-2497. <http://hdl.handle.net/2027.42/48911>en_US
dc.identifier.issn0022-3727en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/48911
dc.description.abstractWire-like SnO2 is fabricated by the wet chemical method. X-ray diffraction measurements show that the obtained samples have rutile-type structure. Electron transmission microscopy experiments illustrate that the wire-like SnO2 ranged from 10 to 50 nm in width and several microns (µm) in length. The high-resolution TEM indicates that SnO2 wires are single crystals. The possible growth mechanism is proposed, and it is found that polyethylene glycol plays an important role in obtaining the wire-like and nano-rods morphology of SnO2. The band gap is determined to be 3.56 eV. Two photoluminescence peaks located at 389 and 470 nm are observed. Our fabrication method promises a simple way of synthesizing wire-like SnO2 at a low temperature of 350°C.en_US
dc.format.extent3118 bytes
dc.format.extent872936 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherIOP Publishing Ltden_US
dc.titleFabrication and characterization of wire-like SnO2en_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI 48109-2104, USAen_US
dc.contributor.affiliationumDepartment of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, MI 48109-2104, USAen_US
dc.contributor.affiliationotherDepartment of Applied Physics, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of Chinaen_US
dc.contributor.affiliationotherDepartment of Applied Physics, University of Electronic Science and Technology of China, Chengdu, 610054, People's Republic of China; International Center for Material Physics, Chinese Academy of Sciences, Shenyang 110015, People's Republic of China;en_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/48911/2/d6_12_004.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1088/0022-3727/39/12/004en_US
dc.identifier.sourceJournal of Physics D: Applied Physics.en_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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