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Porous silicon as a sacrificial material

dc.contributor.authorBell, T. E.en_US
dc.contributor.authorGennissen, P. T. J.en_US
dc.contributor.authorDeMunter, D.en_US
dc.contributor.authorKuhl, M.en_US
dc.date.accessioned2006-12-19T19:08:08Z
dc.date.available2006-12-19T19:08:08Z
dc.date.issued1996-12-01en_US
dc.identifier.citationBell, T E; Gennissen, P T J; DeMunter, D; Kuhl, M (1996). "Porous silicon as a sacrificial material ." Journal of Micromechanics and Microengineering. 6(4): 361-369. <http://hdl.handle.net/2027.42/49024>en_US
dc.identifier.issn0960-1317en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/49024
dc.description.abstractPorous silicon is emerging in micromachining technology as an excellent material for use as a sacrificial layer. This is largely due to the ease of fabrication and freedom of design it allows. The rate of pore formation is heavily dependent upon the doping type and concentration of the silicon, allowing patterned porous silicon formation through selective doping of the substrate. Etch-rates above have been reported for highly doped material. Silicon that has been made porous can be quickly and easily removed in a dilute hydroxide solution, as low as 1%. Porous silicon technology offers the unique ability to fabricate free-standing structures in single-crystal silicon with separation distances from the substrate ranging from a few microns to over one hundred microns. A review of the development of porous silicon for micromachining applications is given.en_US
dc.format.extent3118 bytes
dc.format.extent796093 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherIOP Publishing Ltden_US
dc.titlePorous silicon as a sacrificial materialen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumUniversity of Michigan, Department of Electrical Engineering and Computer Science, Ann Arbor, MI, USAen_US
dc.contributor.affiliationotherLaboratory for Electronic Instrumentation, Department of Electrical Engineering, Delft University of Technology, The Netherlandsen_US
dc.contributor.affiliationotherLaboratory for Electronic Instrumentation, Department of Electrical Engineering, Delft University of Technology, The Netherlandsen_US
dc.contributor.affiliationotherTechnical University of Chemnitz-Zwickau, Department of Electrical Engineering, Centre of Microtechnology, 09107, Chemnitz, Germanyen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/49024/2/jm6401.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1088/0960-1317/6/4/002en_US
dc.identifier.sourceJournal of Micromechanics and Microengineering.en_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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