Cost-effective thermal isolation techniques for use on microfabricated DNA amplification and analysis devices
dc.contributor.author | Yang, Ming | en_US |
dc.contributor.author | Pal, Rohit | en_US |
dc.contributor.author | Burns, Mark A. | en_US |
dc.date.accessioned | 2006-12-19T19:08:53Z | |
dc.date.available | 2006-12-19T19:08:53Z | |
dc.date.issued | 2005-01-01 | en_US |
dc.identifier.citation | Yang, Ming; Pal, Rohit; Burns, Mark A (2005). "Cost-effective thermal isolation techniques for use on microfabricated DNA amplification and analysis devices." Journal of Micromechanics and Microengineering. 15(1): 221-230. <http://hdl.handle.net/2027.42/49033> | en_US |
dc.identifier.issn | 0960-1317 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/49033 | |
dc.description.abstract | In this paper, we describe the design, construction and operation of two low cost thermal isolation techniques on a microfabricated DNA amplification and analysis device. The thermal conduit technique is based on a selective conduction mechanism, while the silicon back dicing technique is based on a selective insulation mechanism. The performances of the two techniques are compared both numerically and experimentally to that of the widely adopted but costly silicon back etching technique. Temperature gradients as high as 108 °C cm−1, 92 °C cm−1 and 158 °C cm−1 can be achieved with the three techniques, respectively. Geometric optimization of the two low cost techniques is carried out to further improve their thermal performances. Combining those two techniques can provide comparable thermal isolation results as the back etching technique with significant cost reduction. | en_US |
dc.format.extent | 3118 bytes | |
dc.format.extent | 377976 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.publisher | IOP Publishing Ltd | en_US |
dc.title | Cost-effective thermal isolation techniques for use on microfabricated DNA amplification and analysis devices | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Chemical Engineering, The University of Michigan, Ann Arbor, MI 48109-2136, USA; Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109-2136, USA | en_US |
dc.contributor.affiliationum | Department of Chemical Engineering, The University of Michigan, Ann Arbor, MI 48109-2136, USA; Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109-2136, USA | en_US |
dc.contributor.affiliationum | Department of Chemical Engineering, The University of Michigan, Ann Arbor, MI 48109-2136, USA; Department of Biomedical Engineering, The University of Michigan, Ann Arbor, MI 48109-2136, USA | en_US |
dc.contributor.affiliationumcampus | Ann Arbor | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/49033/2/jmm5_1_031.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1088/0960-1317/15/1/031 | en_US |
dc.identifier.source | Journal of Micromechanics and Microengineering. | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
Files in this item
Remediation of Harmful Language
The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.
Accessibility
If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.