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Cost-effective thermal isolation techniques for use on microfabricated DNA amplification and analysis devices

dc.contributor.authorYang, Mingen_US
dc.contributor.authorPal, Rohiten_US
dc.contributor.authorBurns, Mark A.en_US
dc.date.accessioned2006-12-19T19:08:53Z
dc.date.available2006-12-19T19:08:53Z
dc.date.issued2005-01-01en_US
dc.identifier.citationYang, Ming; Pal, Rohit; Burns, Mark A (2005). "Cost-effective thermal isolation techniques for use on microfabricated DNA amplification and analysis devices." Journal of Micromechanics and Microengineering. 15(1): 221-230. <http://hdl.handle.net/2027.42/49033>en_US
dc.identifier.issn0960-1317en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/49033
dc.description.abstractIn this paper, we describe the design, construction and operation of two low cost thermal isolation techniques on a microfabricated DNA amplification and analysis device. The thermal conduit technique is based on a selective conduction mechanism, while the silicon back dicing technique is based on a selective insulation mechanism. The performances of the two techniques are compared both numerically and experimentally to that of the widely adopted but costly silicon back etching technique. Temperature gradients as high as 108 °C cm−1, 92 °C cm−1 and 158 °C cm−1 can be achieved with the three techniques, respectively. Geometric optimization of the two low cost techniques is carried out to further improve their thermal performances. Combining those two techniques can provide comparable thermal isolation results as the back etching technique with significant cost reduction.en_US
dc.format.extent3118 bytes
dc.format.extent377976 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherIOP Publishing Ltden_US
dc.titleCost-effective thermal isolation techniques for use on microfabricated DNA amplification and analysis devicesen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Chemical Engineering, The University of Michigan, Ann Arbor, MI 48109-2136, USA; Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109-2136, USAen_US
dc.contributor.affiliationumDepartment of Chemical Engineering, The University of Michigan, Ann Arbor, MI 48109-2136, USA; Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109-2136, USAen_US
dc.contributor.affiliationumDepartment of Chemical Engineering, The University of Michigan, Ann Arbor, MI 48109-2136, USA; Department of Biomedical Engineering, The University of Michigan, Ann Arbor, MI 48109-2136, USAen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/49033/2/jmm5_1_031.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1088/0960-1317/15/1/031en_US
dc.identifier.sourceJournal of Micromechanics and Microengineering.en_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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