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A FORTRAN computer program for converting among atom, weight, and oxide percentages for use in analytical electron microscopy
dc.contributor.authorBigelow, Wilbur C.en_US
dc.date.accessioned2007-04-06T18:58:20Z
dc.date.available2007-04-06T18:58:20Z
dc.date.issued1985en_US
dc.identifier.citationBigelow, W. C. (1985)."A FORTRAN computer program for converting among atom, weight, and oxide percentages for use in analytical electron microscopy." Journal of Electron Microscopy Technique 2(6): 637-642. <http://hdl.handle.net/2027.42/50385>en_US
dc.identifier.issn0741-0581en_US
dc.identifier.issn1553-0817en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/50385
dc.description.abstractA FORTRAN program is given which will (1) calculate atom and weight percentages from a given chemical formula: (2) calculate atom percentages from given weight percentages; (3) calculate oxide percentages from given weight percentages; and (4) calculate weight percentages from given oxide percentages. The program is interactive, easy to use, and very convenient for use in electron beam microanalytical work.en_US
dc.format.extent236195 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.publisherWiley Subscription Services, Inc., A Wiley Companyen_US
dc.subject.otherLife and Medical Sciencesen_US
dc.subject.otherCell & Developmental Biologyen_US
dc.titleA FORTRAN computer program for converting among atom, weight, and oxide percentages for use in analytical electron microscopyen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelScience (General)en_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Materials and Metallurgical Engineering, University of Michigan, Ann Arbor, Michigan 48109 ; Dept. of Materials and Metallurgical Engineering, Dow Building, 1500 Hayward Street, University of Michigan, Ann Arbor, MI 48109en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/50385/1/1060020613_ftp.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1002/jemt.1060020613en_US
dc.identifier.sourceJournal of Electron Microscopy Techniqueen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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