View Item 

Show simple item record

Substantial pressure effect on the resistivity and Curie temperature for the diluted magnetic semiconductor Sb 2– x V x Te 3

dc.contributor.authorDyck, Jeffrey S.en_US
dc.contributor.authorAhilan, K.en_US
dc.contributor.authorAronson, M. C.en_US
dc.contributor.authorUher, Ctiraden_US
dc.contributor.authorLoš Ák, P.en_US
dc.date.accessioned2007-07-11T18:15:53Z
dc.date.available2007-07-11T18:15:53Z
dc.date.issued2006-07en_US
dc.identifier.citationDyck, J. S.; Ahilan, K.; Aronson, M. C.; Uher, C.; LoŠ Ák, P. (2006). "Substantial pressure effect on the resistivity and Curie temperature for the diluted magnetic semiconductor Sb 2– x V x Te 3 ." physica status solidi b 243(8): 1862-1866. <http://hdl.handle.net/2027.42/55234>en_US
dc.identifier.issn0370-1972en_US
dc.identifier.issn1521-3951en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/55234
dc.description.abstractThe influence of hydrostatic pressure on the electrical resistivity Ρ and ferromagnetic transition temperature T C of bulk, single crystal Sb 1– x V x Te 3 with x = 0.03 is presented. Pressure strongly suppresses Ρ at all temperatures, with an overall decrease of about 35% at 1.6 GPa. The peak in Ρ , a signature of T C , moves to lower temperature with increasing pressure. An overall suppression of T C near 40% at 1.6 GPa is observed. The results are discussed within the context of a carrier-mediated ferromagnetic exchange interaction. (© 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)en_US
dc.format.extent180063 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.publisherWILEY-VCH Verlagen_US
dc.subject.otherPhysicsen_US
dc.titleSubstantial pressure effect on the resistivity and Curie temperature for the diluted magnetic semiconductor Sb 2– x V x Te 3en_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelMaterials Science and Engineeringen_US
dc.subject.hlbtoplevelScienceen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Physics, University of Michigan, Ann Arbor, MI 48109, USA ;en_US
dc.contributor.affiliationumDepartment of Physics, University of Michigan, Ann Arbor, MI 48109, USAen_US
dc.contributor.affiliationumDepartment of Physics, University of Michigan, Ann Arbor, MI 48109, USAen_US
dc.contributor.affiliationotherDepartment of Physics, John Carroll University, University Heights, OH 44118 ; Phone: +00 1 216 397 4560, Fax: +00 1 216 397 4499en_US
dc.contributor.affiliationotherFaculty of Chemical Technology, University of Pardubice, čs. LegiÍ Square 565, 532 10 Pardubice, Czech Republicen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/55234/1/1862_ftp.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1002/pssb.200541287en_US
dc.identifier.sourcephysica status solidi ben_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


Files in this item

Name:
1862_ftp.pdf
Size:
175.8KB
Format:
PDF
View/Open

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.