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RF MEMS impedance tuners for 6–24 GHz applications
dc.contributor.authorVähä-Heikkilä, Taunoen_US
dc.contributor.authorVan Caekenberghe, Koen A. P. A.en_US
dc.contributor.authorVaris, Jussien_US
dc.contributor.authorTuovinen, Jussien_US
dc.contributor.authorRebeiz, Gabriel M.en_US
dc.date.accessioned2007-09-20T18:33:35Z
dc.date.available2008-09-08T14:25:14Zen_US
dc.date.issued2007-05en_US
dc.identifier.citationVÄhÄ-HeikkilÄ, Tauno; Van Caekenberghe, Koen; Varis, Jussi; Tuovinen, Jussi; Rebeiz, Gabriel M. (2007)."RF MEMS impedance tuners for 6–24 GHz applications." International Journal of RF and Microwave Computer-Aided Engineering 17(3): 265-278. <http://hdl.handle.net/2027.42/56026>en_US
dc.identifier.issn1096-4290en_US
dc.identifier.issn1099-047Xen_US
dc.identifier.urihttps://hdl.handle.net/2027.42/56026
dc.description.abstractRF MEMS tuners with wide impedance coverage have been developed for 6–24 GHz noise parameter and load-pull measurement systems. The tuners are based on triple-, double-, and single-stub topologies loaded with switched MEMS capacitors. Several designs are presented, and they use 10–13 switched MEMS capacitors to produce 1024–8192 (2 10 –2 13 ) different impedances. The measured impedance coverage agrees well with simulations and it is the widest ever measured impedance coverage from any planar tuner to-date. © 2007 Wiley Periodicals, Inc. Int J RF and Microwave CAE, 2007.en_US
dc.format.extent586862 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.publisherWiley Subscription Services, Inc., A Wiley Companyen_US
dc.subject.otherEngineeringen_US
dc.subject.otherElectronic, Electrical & Telecommunications Engineeringen_US
dc.titleRF MEMS impedance tuners for 6–24 GHz applicationsen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelElectrical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumMilliLab, VTT Technical Research Centre of Finland, P.O. BOX 1000, 02044 VTT, Finland ; Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109-2122 ; MilliLab, VTT Technical Research Centre of Finland, P.O. BOX 1000, 02044 VTT, Finlanden_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109-2122en_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI 48109-2122 ; Department of Electrical and Computer Engineering, University of California, San Diego, La Jolla, CA 92037en_US
dc.contributor.affiliationotherMilliLab, VTT Technical Research Centre of Finland, P.O. BOX 1000, 02044 VTT, Finlanden_US
dc.contributor.affiliationotherMilliLab, VTT Technical Research Centre of Finland, P.O. BOX 1000, 02044 VTT, Finlanden_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/56026/1/20220_ftp.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1002/mmce.20220en_US
dc.identifier.sourceInternational Journal of RF and Microwave Computer-Aided Engineeringen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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