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Modeling ssDNA electrophoretic migration with band broadening in an entangled or cross-linked network

dc.contributor.authorChen, Zhengen_US
dc.contributor.authorGraham, Richarden_US
dc.contributor.authorBurns, Mark A.en_US
dc.contributor.authorLarson, Ronald G.en_US
dc.date.accessioned2007-09-20T19:01:45Z
dc.date.available2008-09-08T14:25:14Zen_US
dc.date.issued2007-08en_US
dc.identifier.citationChen, Zheng; Graham, Richard; Burns, Mark A.; Larson, Ronald G. (2007)."Modeling ssDNA electrophoretic migration with band broadening in an entangled or cross-linked network." Electrophoresis 28(16): 2783-2800. <http://hdl.handle.net/2027.42/56125>en_US
dc.identifier.issn0173-0835en_US
dc.identifier.issn1522-2683en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/56125
dc.identifier.urihttp://www.ncbi.nlm.nih.gov/sites/entrez?cmd=retrieve&db=pubmed&list_uids=17702058&dopt=citationen_US
dc.description.abstractWe use a coarse-grained model proposed by Graham and Larson based on the temporary network model by Schieber et al.. [1] to simulate the electrophoretic motion of ssDNA and corresponding band broadening due to dispersion. With dimensionless numbers reflecting the experimental physical properties, we are able to simulate ssDNA behavior under weak to moderate electric field strengths for chains with 8–50 entanglements per chain (∼1000–8500 14base pairs), and model smoothly the transition from reptation to oriented reptation. These results are fitted with an interpolation equation, which allows the user to calculate dimensionless mobilities easily from input parameters characterizing the gel matrix, DNA molecules, and field strengths. Dimensionless peak widths are predicted from mobility fluctuations using the central limit theorem and the assumption that the mobility fluctuations are Gaussian. Using results from previous studies of ssDNA physical properties (effective charge Ξq and Kuhn step length b K ) and sieving matrix properties (pore size or tube diameter a ), we give scaling factors to convert the dimensionless values to “real” experimental values, including the mobility, migration distance, and time. We find that the interpolation equation fits well the experimental data of ssDNA mobilities and peak widths, supporting the validity of the coarse-grained model. The model does not account for constraint release and hernia formation, and assumes that the sieving network is a homogeneous microstructure with no temperature gradients and no peak width due to injection. These assumptions can be relaxed in future work for more accurate prediction.en_US
dc.format.extent696351 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.publisherWILEY-VCH Verlagen_US
dc.subject.otherChemistryen_US
dc.subject.otherBiochemistry and Biotechnologyen_US
dc.titleModeling ssDNA electrophoretic migration with band broadening in an entangled or cross-linked networken_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelChemical Engineeringen_US
dc.subject.hlbsecondlevelChemistryen_US
dc.subject.hlbsecondlevelMaterials Science and Engineeringen_US
dc.subject.hlbsecondlevelMolecular, Cellular and Developmental Biologyen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.subject.hlbtoplevelScienceen_US
dc.subject.hlbtoplevelHealth Sciencesen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Chemical Engineering, The University of Michigan, Ann Arbor, MI, USAen_US
dc.contributor.affiliationumDepartment of Chemical Engineering, The University of Michigan, Ann Arbor, MI, USA ; Current address: School of Physics and Astronomy, University of Leeds, Leeds LS2 9JT, UKen_US
dc.contributor.affiliationumDepartment of Chemical Engineering, The University of Michigan, Ann Arbor, MI, USA ; Department of Biomedical Engineering, The University of Michigan, Ann Arbor, MI, USAen_US
dc.contributor.affiliationumDepartment of Chemical Engineering, The University of Michigan, Ann Arbor, MI, USA ; Department of Chemical Engineering, The University of Michigan, Ann Arbor, MI 48105, USA Fax: +1-734-763-0459en_US
dc.identifier.pmid17702058en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/56125/1/2783_ftp.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1002/elps.200600684en_US
dc.identifier.sourceElectrophoresisen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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