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Doping-Dependent Electrical Characteristics of SnO 2 Nanowires Q.W. acknowledges support from the National Science Foundation (NSF) of China (grant number 50602014), the Program for New Century Excellent Talents at Hunan University, and the Foundation for the Author of National Excellent Doctoral Dissertation of China (200752). W.L. acknowledges support from the NSF (ECS-0601478) and the Rackham Faculty Research Grant.

dc.contributor.authorWan, Qingen_US
dc.contributor.authorDattoli, Eric Neilen_US
dc.contributor.authorLu, Weien_US
dc.date.accessioned2008-05-12T13:41:44Z
dc.date.available2009-04-09T15:01:14Zen_US
dc.date.issued2008-04en_US
dc.identifier.citationWan, Qing; Dattoli, Eric; Lu, Wei (2008). "Doping-Dependent Electrical Characteristics of SnO 2 Nanowires Q.W. acknowledges support from the National Science Foundation (NSF) of China (grant number 50602014), the Program for New Century Excellent Talents at Hunan University, and the Foundation for the Author of National Excellent Doctoral Dissertation of China (200752). W.L. acknowledges support from the NSF (ECS-0601478) and the Rackham Faculty Research Grant. ." Small 4(4): 451-454. <http://hdl.handle.net/2027.42/58583>en_US
dc.identifier.issn1613-6810en_US
dc.identifier.issn1613-6829en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/58583
dc.identifier.urihttp://www.ncbi.nlm.nih.gov/sites/entrez?cmd=retrieve&db=pubmed&list_uids=18383191&dopt=citation
dc.description.abstractNo Abstract.en_US
dc.format.extent237307 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.publisherWILEY-VCH Verlagen_US
dc.subject.otherPolymers and Materials Scienceen_US
dc.subject.otherGeneral Materials Scienceen_US
dc.titleDoping-Dependent Electrical Characteristics of SnO 2 Nanowires Q.W. acknowledges support from the National Science Foundation (NSF) of China (grant number 50602014), the Program for New Century Excellent Talents at Hunan University, and the Foundation for the Author of National Excellent Doctoral Dissertation of China (200752). W.L. acknowledges support from the NSF (ECS-0601478) and the Rackham Faculty Research Grant.en_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelMaterials Science and Engineeringen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science University of Michigan Ann Arbor, MI 48109 (USA) ; Micro-Nano Technologies Research Center Hunan University Changsha 410082 (P.R. China) ; Department of Electrical Engineering and Computer Science University of Michigan Ann Arbor, MI 48109 (USA). Fax: (+734) 763-9324en_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science University of Michigan Ann Arbor, MI 48109 (USA)en_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science University of Michigan Ann Arbor, MI 48109 (USA) ; Department of Electrical Engineering and Computer Science University of Michigan Ann Arbor, MI 48109 (USA). Fax: (+734) 763-9324en_US
dc.identifier.pmid18383191
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/58583/1/451_ftp.pdf
dc.identifier.doihttp://dx.doi.org/10.1002/smll.200700753en_US
dc.identifier.sourceSmallen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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