Show simple item record

Vibration Isolation and Shock Protection for MEMS.

dc.contributor.authorYoon, Sang Wonen_US
dc.date.accessioned2009-05-15T15:14:08Z
dc.date.availableNO_RESTRICTIONen_US
dc.date.available2009-05-15T15:14:08Z
dc.date.issued2009en_US
dc.date.submitted2009en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/62282
dc.description.abstractForces arising from environmental sources have profound influence on the functioning of microelectromechanical (MEMS) devices. Two examples include mechanical vibration and shock, which can significantly degrade the performance and reliability of MEMS. Mechanical vibrations can generate unwanted device output, and shock loads can permanently damage device structures. Thus, there is strong motivation to understand and to mitigate the adverse effects of shock and vibration on MEMS devices. The effects of mechanical vibrations and the means to mitigate them are not well understood. Herein, we present detailed analyses that identify how vibration degrades device performance, especially for MEMS gyroscopes. Two classes of gyroscopes are studied and modeled in detail: Tuning fork gyroscopes (TFG) and vibrating ring gyroscopes (VRG). Despite their differential operation, all capacitive TFGs are affected by vibration due to nonlinear characteristics of their capacitive drive/sense electrodes, while some TFG designs are shown to be more vibration-tolerant than others by >99%. By contrast, VRGs remain immune to vibration effects due to the decoupling of vibration excited modes and sensing modes. Overall, vibration effects in gyroscopes and other MEMS can also be reduced by integrating a vibration-isolation platform, and TFG’s vibration sensitivity is improved by >99% using a properly-designed platform. Prior shock protection in MEMS has utilized two strategies: optimizing device-dimensions and hard shock stops. While both strategies afford protection, they also incur a trade-off in shock versus device performance. Two new shock-protection technologies are developed herein: (1) nonlinear-spring shock stops and (2) soft-coating shock stops. The nonlinear springs form compliant motion-limiting stops that reduce impact. Similarly, soft coating stops utilize a soft thin-film layer on an otherwise hard surface to increase the surface compliance and energy dissipation. Both solutions decrease the impact forces generated between the device mass and the shock stops, and enable wafer-level, batch fabrication processes compatible with microfabrication techniques. Simulation and experimental results clearly demonstrate that both solutions offer superior shock protection compared to conventional hard shock stops. Following testing of more than 70 devices, we observe a twenty fold increase in device-survival rate for devices protected either by silicon nonlinear-spring stop or by Parylene soft-coating stops.en_US
dc.format.extent4184564 bytes
dc.format.extent1373 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_USen_US
dc.subjectVibration Analysis and Isolation for MEMS and Shock Protection for MEMSen_US
dc.subjectAnalysis and Comparison of the Vibration Sensitivities of MEMS Devices, Including Two Common Designs for MEMS Angular Rate Gyrosen_US
dc.subjectQuantitatively Demonstration of Vibration Suppression by Integrating a Vibration Isolator for MEMS and Provide Guidelines for MEMS Isolator Designen_US
dc.subjectDevelopment of Two New Shock Protection Concepts for MEMS Devicesen_US
dc.subjectIdentification of a New Fracture Mechanism Induced by Impact Between the Device Mass and Its Motion-limiting (Hard) Shock Stopsen_US
dc.titleVibration Isolation and Shock Protection for MEMS.en_US
dc.typeThesisen_US
dc.description.thesisdegreenamePhDen_US
dc.description.thesisdegreedisciplineElectrical Engineeringen_US
dc.description.thesisdegreegrantorUniversity of Michigan, Horace H. Rackham School of Graduate Studiesen_US
dc.contributor.committeememberNajafi, Khalilen_US
dc.contributor.committeememberPerkins, Noel C.en_US
dc.contributor.committeememberGrosh, Karlen_US
dc.contributor.committeememberLee, Sangwooen_US
dc.contributor.committeememberWise, Kensall D.en_US
dc.contributor.committeememberYoon, Euisiken_US
dc.subject.hlbsecondlevelElectrical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/62282/1/swyoon_1.pdf
dc.owningcollnameDissertations and Theses (Ph.D. and Master's)


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.