Large‐aperture, axially symmetric ion‐optical lens systems using new types of electrostatic and magnetic elements
dc.contributor.author | Liu, W. Z. | en_US |
dc.contributor.author | Becchetti, Fredrick D. | en_US |
dc.date.accessioned | 2010-05-06T20:28:39Z | |
dc.date.available | 2010-05-06T20:28:39Z | |
dc.date.issued | 1989-07 | en_US |
dc.identifier.citation | Liu, W. Z.; Becchetti, F. D. (1989). "Large‐aperture, axially symmetric ion‐optical lens systems using new types of electrostatic and magnetic elements." Review of Scientific Instruments 60(7): 1228-1232. <http://hdl.handle.net/2027.42/69355> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/69355 | |
dc.description.abstract | We have developed new types of ion‐optical systems having larger solid angles (i.e., collecting power) and flexibility than many existing designs. They use relatively simple axially symmetric elements, namely solenoids, axial magnetic dipoles, and radial electric field lenses. The systems can focus, with good optical properties, energetic ions in the range of tens of keV up to tens of MeV kinetic energy and are capable of operating in nondispersive, achromatic modes. The key elements for the latter are new types of defocusing magnetic and electrostatic correction lenses. The lens systems have applications in any existing devices used to collect and focus energetic ions (including electrons). Typical devices are: mass spectrometers, leak detectors and gas analyzers, ion sources, accelerators and ion implantation systems, nuclear particle spectrometers, electron microscopes, ion microprobes, and ion‐beam lenses for cancer therapy. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 679729 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/octet-stream | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Large‐aperture, axially symmetric ion‐optical lens systems using new types of electrostatic and magnetic elements | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Physics, Randall Laboratory, The University of Michigan, Ann Arbor, Michigan 48109 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/69355/2/RSINAK-60-7-1228-1.pdf | |
dc.identifier.doi | 10.1063/1.1140295 | en_US |
dc.identifier.source | Review of Scientific Instruments | en_US |
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dc.owningcollname | Physics, Department of |
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