Piezoreflectance characterization of double‐barrier resonant tunneling structures
dc.contributor.author | Tober, R. L. | en_US |
dc.contributor.author | Pamulapati, Jagadeesh | en_US |
dc.contributor.author | Oh, J. E. | en_US |
dc.contributor.author | Bhattacharya, Pallab K. | en_US |
dc.date.accessioned | 2010-05-06T20:37:35Z | |
dc.date.available | 2010-05-06T20:37:35Z | |
dc.date.issued | 1988-09-05 | en_US |
dc.identifier.citation | Tober, R. L.; Pamulapati, J.; Oh, J. E.; Bhattacharya, P. K. (1988). "Piezoreflectance characterization of double‐barrier resonant tunneling structures." Applied Physics Letters 53(10): 883-885. <http://hdl.handle.net/2027.42/69453> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/69453 | |
dc.description.abstract | The piezoreflectance technique has been used to optically characterize resonant tunneling structures that utilize isolated single quantum wells. The heavy‐ and light‐hole transitions associated with the quantum wells were prominent in the spectra of samples with barrier widths ranging from 50 to 34 Å. Their spectral positions depended not only on quantum well and barrier thicknesses, but also significantly on the amount of carrier confinement produced by barrier height. Furthermore, variations in the magnitude of impurity transitions could be observed in the spectra of different samples. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 273315 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Piezoreflectance characterization of double‐barrier resonant tunneling structures | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Solid State Electronics Laboratory and Center for High Frequency Microelectronics, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109‐2122 | en_US |
dc.contributor.affiliationother | U.S. Army Laboratory Command, Harry Diamond Laboratories, 2800 Powder Mill Road, Adelphi, Maryland 20783‐1197 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/69453/2/APPLAB-53-10-883-1.pdf | |
dc.identifier.doi | 10.1063/1.100103 | en_US |
dc.identifier.source | Applied Physics Letters | en_US |
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dc.owningcollname | Physics, Department of |
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