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Nanometer-scale studies of vertical organization and evolution of stacked self-assembled InAs/GaAs quantum dots

dc.contributor.authorLita, B.en_US
dc.contributor.authorGoldman, R. S.en_US
dc.contributor.authorPhillips, J. D.en_US
dc.contributor.authorBhattacharya, Pallab K.en_US
dc.date.accessioned2010-05-06T20:42:52Z
dc.date.available2010-05-06T20:42:52Z
dc.date.issued1999-05-10en_US
dc.identifier.citationLita, B.; Goldman, R. S.; Phillips, J. D.; Bhattacharya, P. K. (1999). "Nanometer-scale studies of vertical organization and evolution of stacked self-assembled InAs/GaAs quantum dots." Applied Physics Letters 74(19): 2824-2826. <http://hdl.handle.net/2027.42/69511>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/69511
dc.description.abstractWe have investigated the vertical organization and evolution of 1-, 5-, 10-, and 20-layer stacks of molecular beam epitaxially grown self-assembled InAs/GaAs quantum dots using high resolution and large-scale cross-sectional scanning tunneling microscopy. We report results regarding the evolution of the dot sizes and shapes, and the assembly of vertically organized columns of stacked dots. As the number of dot layers within a stack is increased, the average spacing between vertically organized columns decreases, and the corresponding dots become more uniform in size. The data also suggest that the coalescence of neighboring stacks of dots has not occurred and therefore coalescence is not the mechanism leading to the observed uniform distribution of dot sizes and column spacings. © 1999 American Institute of Physics.en_US
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dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleNanometer-scale studies of vertical organization and evolution of stacked self-assembled InAs/GaAs quantum dotsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136en_US
dc.contributor.affiliationumSolid State Electronics Laboratory, University of Michigan, Ann Arbor, Michigan 48109-2122en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/69511/2/APPLAB-74-19-2824-1.pdf
dc.identifier.doi10.1063/1.124026en_US
dc.identifier.sourceApplied Physics Lettersen_US
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dc.owningcollnamePhysics, Department of


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