View Item 

Show simple item record

Signal averaging x‐ray streak camera with picosecond jitter
dc.contributor.authorMaksimchuk, Anatolyen_US
dc.contributor.authorKim, M.en_US
dc.contributor.authorWorkman, J.en_US
dc.contributor.authorKorn, G.en_US
dc.contributor.authorSquier, Jeffen_US
dc.contributor.authorDu, D.en_US
dc.contributor.authorUmstadter, Donald P.en_US
dc.contributor.authorMourou, Gerard A.en_US
dc.contributor.authorBouvier, M.en_US
dc.date.accessioned2010-05-06T20:49:21Z
dc.date.available2010-05-06T20:49:21Z
dc.date.issued1996-03en_US
dc.identifier.citationMaksimchuk, A.; Kim, M.; Workman, J.; Korn, G.; Squier, J.; Du, D.; Umstadter, D.; Mourou, G.; Bouvier, M. (1996). "Signal averaging x‐ray streak camera with picosecond jitter." Review of Scientific Instruments 67(3): 697-699. <http://hdl.handle.net/2027.42/69581>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/69581
dc.description.abstractWe have developed an averaging picosecond x‐ray streak camera using a dc‐biased photoconductive switch as a generator of a high‐voltage ramp. The streak camera is operated at a sweep speed of up to 8 ps/mm, shot‐to‐shot jitter is less than ±1 ps. The streak camera has been used to measure the time history of broadband x‐ray emission from an ultrashort pulse laser‐produced plasma. Accumulation of the streaked x‐ray signals significantly improved the signal‐to‐noise ratio of the data obtained. © 1996 American Institute of Physics.en_US
dc.format.extent3102 bytes
dc.format.extent105227 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleSignal averaging x‐ray streak camera with picosecond jitteren_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCenter for Ultrafast Optical Science, University of Michigan, Ann Arbor, Michigan 48109‐2099en_US
dc.contributor.affiliationumMedox Electro‐Optics Inc., Ann Arbor, Michigan 48108en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/69581/2/RSINAK-67-3-697-1.pdf
dc.identifier.doi10.1063/1.1146843en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
dc.identifier.citedreferenceM. M. Murnane, H. C. Kapteyn, and R. W. Falcone, Appl. Phys. Lett. 56, 1948 (1990).en_US
dc.identifier.citedreferenceJ. C. Kieffer, M. Chaker, J. P. Matte, H. Pépin, C. Y. Côté, Y. Beaudoin, T. W. Johnston, C. Y. Chien, S. Coe, G. Mourou, and O. Peyrusse, Phys. Fluids B 5, 2676 (1993).en_US
dc.identifier.citedreferenceOSA Proceedings on Short Wavelength Coherent Radiation: Generation and Applications, 1991, edited by P. Bucksbaum and N. Ceglio (Optical Society of America, Washington, DC, 1991), Vol. 11 and references therein.en_US
dc.identifier.citedreferenceW. Knox and G. Mourou, Opt. Commun. 37, 203 (1981).en_US
dc.identifier.citedreferenceD. Du, J. Squier, S. Kane, G. Korn, G. Mourou, C. Bogusch, and C. Cotton, Opt. Lett. 20, 2114 (1995).en_US
dc.identifier.citedreferenceG. Mourou and W. Knox, Appl. Phys. Lett. 35, 492 (1979).en_US
dc.identifier.citedreferenceM. M. Murnane, H. C. Kapteyn, and R. W. Falcone, Phys. Rev. Lett. 62, 155 (1989).en_US
dc.identifier.citedreferenceJ. Workman, A. Maksimchuk, X. Liu, U. Ellenberger, J. S. Coe, C.-Y. Chien, and D. Umstadter, Phys. Rev. Lett. 75, 2324 (1995).en_US
dc.identifier.citedreferenceC. Wülker, W. Theoband, F. P. Shäfer, and J. S. Bakos, Phys. Rev. E 50, 4920 (1994).en_US
dc.owningcollnamePhysics, Department of


Files in this item

Name:
RSINAK-67-3-697-1.pdf
Size:
102.7KB
Format:
PDF
View/Open

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.