Low‐loss, single‐mode In0.53Ga0.47As/In0.52Al0.48As/InP optical waveguides fabricated by Zn‐induced impurity‐induced layer disordering
dc.contributor.author | Lai, Richard K. | en_US |
dc.contributor.author | Pamulapati, Jagadeesh | en_US |
dc.contributor.author | Bhattacharya, Pallab K. | en_US |
dc.contributor.author | Baird, R. J. | en_US |
dc.date.accessioned | 2010-05-06T20:51:22Z | |
dc.date.available | 2010-05-06T20:51:22Z | |
dc.date.issued | 1991-11-01 | en_US |
dc.identifier.citation | Lai, R.; Pamulapati, J.; Bhattacharya, P. K.; Baird, R. J. (1991). "Low‐loss, single‐mode In0.53Ga0.47As/In0.52Al0.48As/InP optical waveguides fabricated by Zn‐induced impurity‐induced layer disordering." Journal of Applied Physics 70(9): 5136-5137. <http://hdl.handle.net/2027.42/69603> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/69603 | |
dc.description.abstract | We have investigated the properties of Zn diffusion in the In0.53Ga0.47As/In0.52Al0.48As superlattice and have made optical guides delineated by Zn‐induced layer disordering in the multilayers. Measurements on the single‐mode waveguides show loses as low as 2.3 dB/cm including coupling loss. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 233524 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Low‐loss, single‐mode In0.53Ga0.47As/In0.52Al0.48As/InP optical waveguides fabricated by Zn‐induced impurity‐induced layer disordering | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Solid State Electronics Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, Michigan 48109‐2212 | en_US |
dc.contributor.affiliationum | Analytical Sciences Department, Research Staff, Ford Motor Company, P. O. Box 2053, Dearborn, Michigan 48121‐2053 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/69603/2/JAPIAU-70-9-5136-1.pdf | |
dc.identifier.doi | 10.1063/1.348989 | en_US |
dc.identifier.source | Journal of Applied Physics | en_US |
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dc.owningcollname | Physics, Department of |
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