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Picosecond laser-pump, x-ray probe spectroscopy of GaAs

dc.contributor.authorAdams, B. W.en_US
dc.contributor.authorDeCamp, M. F.en_US
dc.contributor.authorDufresne, E. M.en_US
dc.contributor.authorReis, D. A.en_US
dc.date.accessioned2010-05-06T20:59:25Z
dc.date.available2010-05-06T20:59:25Z
dc.date.issued2002-12en_US
dc.identifier.citationAdams, B. W.; DeCamp, M. F.; Dufresne, E. M.; Reis, D. A. (2002). "Picosecond laser-pump, x-ray probe spectroscopy of GaAs." Review of Scientific Instruments 73(12): 4150-4156. <http://hdl.handle.net/2027.42/69690>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/69690
dc.description.abstractA laser-pump, x-ray probe spectroscopic experiment is described, and the results are shown. The Ga KαKα x-ray fluorescence following x-ray absorption, at the Ga K absorption edge was measured, and its increase due to excitation with subpicosecond pulses of laser light at 4.6 eV photon energy was determined. The x-ray absorption, and thus the fluorescence, is increased for about 200 ps after the laser pulse because additional final states for the x-ray absorption are cleared in the valence band by the laser excitation. The technique could eventually lead to a femtosecond pump-probe spectroscopy with an absolute reference energy level and also to a femtosecond x-ray detector. This is of particular importance to future short-pulse x-ray sources, such as free-electron lasers. © 2002 American Institute of Physics.en_US
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dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titlePicosecond laser-pump, x-ray probe spectroscopy of GaAsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumUniversity of Michigan, Department of Physics, 500 E. University Drive, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherAdvanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/69690/2/RSINAK-73-12-4150-1.pdf
dc.identifier.doi10.1063/1.1516849en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
dc.identifier.citedreferenceM. DeCamp et al., Nature (London) NATUAS413, 825 (2001).en_US
dc.identifier.citedreferenceS. Techert, F. Schotte, and M. Wulff, Phys. Rev. Lett. PRLTAO86, 2030 (2001).en_US
dc.identifier.citedreferenceR. Neutze et al., Phys. Rev. Lett. PRLTAO87, 195 508 (2001).en_US
dc.identifier.citedreferenceC. Bressler et al., JCP JCPSA6116, 2955 (2002).en_US
dc.identifier.citedreferenceR. Schoenlein et al., Synchrotron Radiat. News ZZZZZZ14, 20 (2001).en_US
dc.identifier.citedreferenceJ. Arthur, G. Materlik, R. Tatchyn, and H. Winick, Rev. Sci. Instrum. RSINAK66, 1987 (1995).en_US
dc.identifier.citedreferenceJ. Schneider, Nucl. Instrum. Methods Phys. Res. A NIMAER398, 41 (1997).en_US
dc.identifier.citedreferenceH. Padmore, R. Schoenlein, and A. Zholents, Synchrotron Radiat. News ZZZZZZ14, 26 (2001).en_US
dc.identifier.citedreferenceB. Adams, Nucl. Instrum. Methods Phys. Res. A NIMAER459, 339 (2001).en_US
dc.identifier.citedreferenceA. Leitenstorfer et al., Phys. Rev. Lett. PRLTAO76, 1545 (1996).en_US
dc.identifier.citedreferenceJ. Collet, Phys. Rev. B PRBMDO47, 10 279 (1993).en_US
dc.identifier.citedreferenceN. Nintunze and M. Osman, Phys. Rev. B PRBMDO50, 10 706 (1994).en_US
dc.identifier.citedreferenceD. Snoke, W. Rühle, and Y.-C. L. E. Bauser, Phys. Rev. B PRBMDO45, 10 979 (1992).en_US
dc.identifier.citedreferenceM. Cavicchia and R. Alfano, Phys. Rev. B PRBMDO48, 5696 (1993).en_US
dc.identifier.citedreferenceR. Kumar and A. Vengurlekar, Phys. Rev. B PRBMDO54, 10 292 (1996).en_US
dc.identifier.citedreferenceR. Kumar et al., Phys. Rev. B PRBMDO54, 17 591 (1996).en_US
dc.identifier.citedreferenceK. Burr and C. Tang, Appl. Phys. Lett. APPLAB74, 1734 (1999).en_US
dc.identifier.citedreferenceT. Elsaesser, J. Shah, L. Rota, and P. Lugli, Phys. Rev. Lett. PRLTAO66, 1757 (1991).en_US
dc.identifier.citedreferenceE. Mayer, A. Lohner, M. Woerner, and T. Elsaesser, Phys. Rev. B PRBMDO46, 1878 (1992).en_US
dc.identifier.citedreferenceS. Hunsche et al., Phys. Rev. B PRBMDO48, 17 818 (1993).en_US
dc.identifier.citedreferenceA. Vengurlekar and S. Jha, Phys. Rev. B PRBMDO41, 1286 (1990).en_US
dc.identifier.citedreferenceM. Beard, G. Turner, and C. Schmuttenmaer, Phys. Rev. B PRBMDO62, 15 764 (2000).en_US
dc.identifier.citedreferenceT. Boykin, Phys. Rev. B PRBMDO54, 8107 (1996).en_US
dc.identifier.citedreferenceK. Hämäläinen, D. Siddons, J. Hastings, and L. Berman, Phys. Rev. Lett. PRLTAO67, 2850 (1991).en_US
dc.identifier.citedreferenceE. Glezer, Y. Siegal, L. Huang, and E. Mazur, Phys. Rev. B PRBMDO51, 6959 (1995).en_US
dc.identifier.citedreferenceE. Dufresne et al., Rev. Sci. Instrum. RSINAK73, 1511 (2002).en_US
dc.identifier.citedreferenceJ. DuMond, Phys. Rev. PHRVAO52, 872 (1937).en_US
dc.identifier.citedreferenceT. Matsushita and H. Hashizume, in Handbook of Synchrotron Radiation, edited by E. Koch (North-Holland, Amsterdam, 1983), Vol. 1, Chap. 4.en_US
dc.identifier.citedreferenceE. Dufresne et al., Appl. Phys. Lett. APPLAB79, 4085 (2001).en_US
dc.identifier.citedreferenceG. Röntec AG, Berlin, Röntec X-Flash detector, details on http://www.roentec.de, 1997.en_US
dc.identifier.citedreferenceC. Fiorini et al., Rev. Sci. Instrum. RSINAK68, 2461 (1997).en_US
dc.identifier.citedreferenceC. Fiorini et al., J. X-Ray Sci. Technol. JXSTE57, 117 (1997).en_US
dc.identifier.citedreferenceCanberra, Canberra, Inc., specifications of model 2025 AFT research amplifier, http://www.canberra.com/PCatalog.nsf/all/NIM_PDF/$file/3m2025.pdf, 2001.en_US
dc.identifier.citedreferenceG. Jennings, W. Jäger, and L. Chen, Rev. Sci. Instrum. RSINAK73, 362 (2002).en_US
dc.identifier.citedreferenceD. Reis et al., Phys. Rev. Lett. PRLTAO86, 3072 (2001).en_US
dc.identifier.citedreferenceG. Decker, APS accelerator division (private communication, 2002).en_US
dc.identifier.citedreferenceS. Techert et al., in Winter School Les Houches (ESRF, http://www.esrf.fr/conferences/FEL_SR/Introduction.htm, 2001).en_US
dc.identifier.citedreferenceM. Wulff et al., Nucl. Instrum. Methods Phys. Res. A NIMAER398, 69 (1997).en_US
dc.identifier.citedreferenceG. Göger et al., Phys. Rev. Lett. PRLTAO84, 5812 (2000).en_US
dc.identifier.citedreferenceM. Joschko et al., Phys. Rev. B PRBMDO58, 10 470 (1998).en_US
dc.identifier.citedreferenceA. Alexandrou, V. Berger, and D. Hulin, Phys. Rev. B PRBMDO52, 4654 (1995).en_US
dc.identifier.citedreferenceF. Ganikhov, K. Burr, and C. Tang, Appl. Phys. Lett. APPLAB73, 64 (1998).en_US
dc.identifier.citedreferenceS. Bar-Ad et al., Phys. Rev. Lett. PRLTAO77, 3177 (1996).en_US
dc.identifier.citedreferenceP. Carra, M. Fabrizio, and B. Thole, Phys. Rev. Lett. PRLTAO74, 3700 (1995).en_US
dc.identifier.citedreferenceIn TESLA technical design report, Part V, http://tesla.desy.de/new_pages/TDR_CD/PartV/fel.html,DESY, edited by G. Materlik and T. Tschentscher (DESY, Notkestr. 85, D-22607 Hamburg, Germany, 2001).en_US
dc.identifier.citedreferenceT. Glover, R. Schoenlein, A. Chin, and C. Shank, Phys. Rev. Lett. PRLTAO76, 2468 (1996).en_US
dc.owningcollnamePhysics, Department of


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