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Noise analysis and optimization of a charge transformer, a noise-matching device for single electron transistors

dc.contributor.authorKurdak, Ç.en_US
dc.contributor.authorLewis, K. M.en_US
dc.date.accessioned2010-05-06T21:04:34Z
dc.date.available2010-05-06T21:04:34Z
dc.date.issued2003-03-15en_US
dc.identifier.citationKurdak, Ç.; Lewis, K. M. (2003). "Noise analysis and optimization of a charge transformer, a noise-matching device for single electron transistors." Journal of Applied Physics 93(6): 3364-3369. <http://hdl.handle.net/2027.42/69743>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/69743
dc.description.abstractOperation and noise analysis of a recently proposed noise-matching device, called a charge transformer, are presented. The charge transformer consists of N identical capacitors and 3N+13N+1 switches that enable the capacitors to be connected either in series or in parallel. The device is operated by switching back and forth between these two configurations at speeds faster than the signals that will be measured. We show that an ideal charge transformer can achieve perfect noise matching between any single-electron transistor and a high capacitance device that is under test. We also discuss how a realistic charge transformer made using switches with finite capacitance and resistance should be operated to achieve optimum noise performance. © 2003 American Institute of Physics.en_US
dc.format.extent3102 bytes
dc.format.extent81087 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleNoise analysis and optimization of a charge transformer, a noise-matching device for single electron transistorsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Physics, University of Michigan, Ann Arbor, Michigan 48109-1120en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/69743/2/JAPIAU-93-6-3364-1.pdf
dc.identifier.doi10.1063/1.1544412en_US
dc.identifier.sourceJournal of Applied Physicsen_US
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dc.owningcollnamePhysics, Department of


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